FE-TEM w EDS/EELS, JEOL JEM-2100F

This microscope is equipped with a field-emission gun, thus it provides an atomic resolution in imaging and good energy resolution in spectroscopy. In addition to normal imaging, this microscope offers the atomic lattice images with high contrast. Moreover, since this microscope is also equipped with many attachments, a complete characterization of various techniques can be performed in one microscope. For example, scanning transmission electron microscopy (STEM) with a sub-nanometer probe offers the opportunity to examine structure and composition at atomic resolution using bright-field imaging and z-contrast high-angle dark-field imaging. X-ray energy dispersion detector (EDX) allows chemical composition characterization. By employing Gatan imaging filter, both electron energy-loss spectroscopy and energy-filtered imaging can be obtained. Form the former, quantitative chemical analysis is possible as well as information on chemical bonding and electronic structure, while the later help map out elemental distribution accurately. Bi-prison facilitates electrostatic and magnetic field distribution in materials .