The multifunctional scanning probe microscopy (or called atomic force microscope(AFM)) can provide nanoscale material identification and analysis. The AFM can be operated in different modes such as contact mode, tapping mode, and peak force mode for atomic resolution. By detecting the forces from the interactions between samples and cantilever tips, AFM can perform the measurements including surface morphology in air and liquid, quantitative nano mechanical microscopy (QNM) in air and liquid, surface conductivity microscopy, surface potential microscopy (or called KPM), and scanning capacitance microscopy (SCM). CMNST can provides professional analysis and technical services.
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