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Engineering & Materials Science

Electric potential
Networks (circuits)
Light emitting diodes
Dielectric properties
Controllers
Microwaves
Data storage equipment
Capacitors
Temperature
Substrates
Photodetectors
Sintering
Permittivity
Metals
Doping (additives)
Costs
Electric power utilization
Digital to analog conversion
Thin film transistors
Organic light emitting diodes (OLED)
Switches
DC-DC converters
Nanowires
Sensors
Hardware
Semiconductor materials
Annealing
Pixels
Asynchronous generators
Built-in self test
Silicon
Feedback
Testing
Microstructure
Indium
Nitrides
Fabrication
Thin films
Oxides
Resonators
Electrodes
Offshore wind farms
Time delay
Leakage currents
Natural frequencies
Phosphors
Microwave frequencies
Electric properties
Bandwidth
Clocks
Neural networks
Communication
Field effect transistors
Transistors
Electrocardiography
Throughput
Modulators
Threshold voltage
Fuzzy logic
Bandpass filters
Antennas
Permanent magnets
Experiments
Electric lamps
Tuning
Monitoring
Capacitance
Scheduling
Damping
Robots
Liquid crystal displays
Pulse width modulation
Display devices
Photoluminescence
Processing
Global positioning system
Topology
Zinc oxide
Static random access storage
Field programmable gate arrays (FPGA)
Conversion efficiency
Buffer layers
Dark currents
Variable frequency oscillators
Control systems
Defects
Tin oxides
Power control
Semiconductor quantum wells
Nanorods
Poles
Sapphire
Operational amplifiers
Modulation
Luminance
Transient analysis
Fuzzy control
Solar cells
Sampling
Heterojunctions

Chemical Compounds

Dielectric properties
Microwaves
Light emitting diodes
Temperature
Sintering
Metals
Substrates
Photodetectors
Permittivity
Networks (circuits)
Doping (additives)
Oxides
Electric potential
Organic light emitting diodes (OLED)
Thin film transistors
Nanowires
Annealing
Phosphors
Microstructure
Thin films
Microwave frequencies
Silicon
Nitrides
Semiconductor materials
Fabrication
Zinc Oxide
Aluminum Oxide
Electric properties
Electrodes
Natural frequencies
Bandpass filters
Pixels
Leakage currents
Field effect transistors
Buffer layers
Threshold voltage
Photoluminescence
Indium
X ray diffraction
Resonators
Solar cells
Dark currents
Nanorods
Oxide films
Scanning electron microscopy
Heterojunctions
Copper
Display devices
Sensors
Luminance
Capacitors
Chemical analysis
High electron mobility transistors
Semiconductor quantum wells
Liquid crystal displays
Powders
Sputtering
Transistors
Electromechanical coupling
Epitaxial layers
Glass
Solid solutions
Ions
Wavelength
Magnetron sputtering
Chemical vapor deposition
Multilayers
Scanning
Polysilicon
Gate dielectrics
Crystalline materials
Field emission
Data storage equipment
Capacitance
Piezoelectric ceramics
Optical properties

Physics & Astronomy

Engineering

light emitting diodes
dielectric properties
photometers
field effect transistors
permittivity
resonators
annealing
nanowires
CMOS
fabrication
electrodes
bandpass filters
metal oxide semiconductors
filters
dark current
transistors
solar cells
electrical properties
nanorods
x rays
etching
photodiodes
magnetron sputtering

Chemistry and Materials

ceramics
nitrides
indium oxides
tin oxides
sapphire
silicon
phosphors
oxides
zinc oxides

General

microwaves
sintering
thin films
metals
microstructure
sensors
output
leakage
resonant frequencies
Q factors
microwave frequencies
caps
chips
buffers
metalorganic chemical vapor deposition
capacitors
injection
vapor deposition
rejection
simulation
scanning electron microscopy

Physics

electric potential
temperature
photoluminescence
quantum wells
coefficients
impedance
acoustics