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Engineering & Materials Science

Electric potential
Networks (circuits)
Light emitting diodes
Dielectric properties
Controllers
Photodetectors
Microwaves
Substrates
Temperature
Capacitors
Sintering
Permittivity
Metals
Nanowires
Thin film transistors
Data storage equipment
Doping (additives)
Electric power utilization
Digital to analog conversion
DC-DC converters
Sensors
Organic light emitting diodes (OLED)
Switches
Indium
Costs
Nitrides
Thin films
Semiconductor materials
Annealing
Fabrication
Asynchronous generators
Hardware
Pixels
Microstructure
Feedback
Electric properties
Zinc oxide
Resonators
Silicon
Electrodes
Oxides
Offshore wind farms
Leakage currents
Time delay
Natural frequencies
Phosphors
Threshold voltage
Field effect transistors
Microwave frequencies
Communication
Neural networks
Fuzzy logic
Electrocardiography
Bandpass filters
Transistors
Permanent magnets
Antennas
Modulators
Electric lamps
Bandwidth
Experiments
Photoluminescence
Dark currents
Capacitance
Tuning
Throughput
Monitoring
Damping
Nanorods
Clocks
Liquid crystal displays
Robots
Buffer layers
Pulse width modulation
Testing
Tin oxides
Oxide films
Sapphire
Global positioning system
Display devices
Glass
Processing
Topology
Scheduling
Heterojunctions
Sputtering
Variable frequency oscillators
Conversion efficiency
Semiconductor quantum wells
Power control
Lighting
Poles
High electron mobility transistors
Operational amplifiers
Transient analysis
Fuzzy control
Control systems
X ray diffraction
Diodes
Luminance

Chemical Compounds

Dielectric properties
Light emitting diodes
Microwaves
Photodetectors
Temperature
Metals
Substrates
Sintering
Permittivity
Thin film transistors
Nanowires
Networks (circuits)
Doping (additives)
Electric potential
Oxides
Zinc Oxide
Organic light emitting diodes (OLED)
Thin films
Nitrides
Annealing
Phosphors
Silicon
Microstructure
Electric properties
Microwave frequencies
Semiconductor materials
Fabrication
Aluminum Oxide
Indium
Electrodes
Field effect transistors
Natural frequencies
Leakage currents
Bandpass filters
Photoluminescence
Threshold voltage
Oxide films
Buffer layers
Dark currents
Pixels
Sputtering
Nanorods
X ray diffraction
Resonators
Heterojunctions
Glass
Solar cells
Scanning electron microscopy
Sensors
Chemical analysis
High electron mobility transistors
Optical properties
Epitaxial layers
Capacitors
Semiconductor quantum wells
Powders
Luminance
Display devices
Copper
Liquid crystal displays
Gate dielectrics
Magnetron sputtering
Electromechanical coupling
Ions
Transistors
Chemical vapor deposition
Electrons
Gallium
Solid solutions
Wavelength
Lighting
Field emission
Nanoparticles
Crystallization
Metallorganic chemical vapor deposition
Photodiodes
Oxygen
Defects
Crystalline materials
Multilayers
Data storage equipment
Scanning
Etching
Piezoelectric ceramics

Physics & Astronomy

Engineering

light emitting diodes
photometers
dielectric properties
field effect transistors
permittivity
nanowires
resonators
annealing
fabrication
CMOS
electrodes
metal oxide semiconductors
bandpass filters
transistors
dark current
filters
electrical properties
nanorods
solar cells
photodiodes
sputtering
x rays
etching
magnetron sputtering
heterojunctions

Chemistry and Materials

ceramics
nitrides
zinc oxides
indium oxides
tin oxides
sapphire
silicon
phosphors
oxides
glass
indium

General

microwaves
sintering
thin films
metals
sensors
microstructure
output
leakage
caps
resonant frequencies
Q factors
buffers
microwave frequencies
metalorganic chemical vapor deposition
chips
vapor deposition
rejection
capacitors
injection
electric contacts
scanning electron microscopy
defects
simulation
templates

Physics

temperature
electric potential
photoluminescence
quantum wells
coefficients
impedance
optical properties