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Engineering & Materials Science

Electric potential
Networks (circuits)
Light emitting diodes
Dielectric properties
Controllers
Data storage equipment
Microwaves
Capacitors
Temperature
Substrates
Sintering
Permittivity
Photodetectors
Costs
Doping (additives)
Digital to analog conversion
Electric power utilization
Switches
Thin film transistors
Organic light emitting diodes (OLED)
Sensors
Hardware
DC-DC converters
Metals
Pixels
Nanowires
Asynchronous generators
Built-in self test
Testing
Feedback
Microstructure
Annealing
Silicon
Time delay
Thin films
Bandwidth
Neural networks
Fabrication
Offshore wind farms
Oxides
Indium
Resonators
Communication
Semiconductor materials
Natural frequencies
Electrodes
Microwave frequencies
Electric properties
Experiments
Clocks
Nitrides
Throughput
Transistors
Electrocardiography
Bandpass filters
Scheduling
Threshold voltage
Modulators
Leakage currents
Field effect transistors
Permanent magnets
Fuzzy logic
Monitoring
Antennas
Phosphors
Tuning
Topology
Capacitance
Electric lamps
Display devices
Damping
Robots
Processing
Pulse width modulation
Liquid crystal displays
Global positioning system
Conversion efficiency
Field programmable gate arrays (FPGA)
Static random access storage
Power control
Photoluminescence
Variable frequency oscillators
Control systems
Solar cells
Poles
Defects
Operational amplifiers
Luminance
Buffer layers
Fuzzy control
Zinc oxide
Color
Transient analysis
Sampling
Modulation
Semiconductor quantum wells
Tin oxides
Kalman filters
Computer simulation
X ray diffraction

Chemical Compounds

Dielectric properties
Microwaves
Light emitting diodes
Sintering
Temperature
Networks (circuits)
Permittivity
Metals
Substrates
Doping (additives)
Electric potential
Oxides
Organic light emitting diodes (OLED)
Thin film transistors
Photodetectors
Nanowires
Microwave frequencies
Microstructure
Annealing
Thin films
Phosphors
Silicon
Fabrication
Electric properties
Bandpass filters
Nitrides
Pixels
Zinc Oxide
Natural frequencies
Electrodes
Field effect transistors
Semiconductor materials
Aluminum Oxide
Leakage currents
Threshold voltage
Solar cells
Buffer layers
Resonators
Photoluminescence
Indium
X ray diffraction
Display devices
Heterojunctions
Oxide films
Scanning electron microscopy
Copper
Sensors
Nanorods
Capacitors
Powders
Luminance
Dark currents
Liquid crystal displays
Semiconductor quantum wells
Chemical analysis
Electromechanical coupling
Sputtering
Transistors
Solid solutions
Glass
Polysilicon
High electron mobility transistors
Gate dielectrics
Scanning
Ions
Magnetron sputtering
Multilayers
Data storage equipment
Piezoelectric ceramics
Wavelength

Physics & Astronomy

Engineering

light emitting diodes
dielectric properties
photometers
field effect transistors
permittivity
resonators
annealing
bandpass filters
CMOS
fabrication
nanowires
electrodes
filters
metal oxide semiconductors
solar cells
dark current
transistors
electrical properties
x rays
etching
nanorods
magnetron sputtering

Chemistry and Materials

ceramics
nitrides
silicon
indium oxides
tin oxides
oxides
phosphors
sapphire

General

microwaves
sintering
thin films
metals
microstructure
sensors
output
Q factors
resonant frequencies
microwave frequencies
leakage
chips
caps
buffers
injection
capacitors
simulation
augmentation
vapor deposition
metalorganic chemical vapor deposition
scanning electron microscopy

Physics

electric potential
temperature
quantum wells
photoluminescence
coefficients
impedance
acoustics