Education and Research Group

Fingerprint Dive into the research topics where Education and Research Group is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.

Thin films Engineering & Materials Science
Light emitting diodes Engineering & Materials Science
Substrates Engineering & Materials Science
Photoluminescence Engineering & Materials Science
Oxide films Engineering & Materials Science
Electric properties Engineering & Materials Science
Sputtering Engineering & Materials Science
light emitting diodes Physics & Astronomy

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Profiles

No photo of Po-Tsung Hsieh

Po-Tsung Hsieh

Person: Academic

20022016
No photo of Chih-Chien Lin

Chih-Chien Lin

Person: Academic

20032019
No photo of Kuang-I Lin

Kuang-I Lin

Person: Academic

20032018

Research Output 2002 2019

Demonstration of annealing-free metal-insulator-semiconductor (mis) ohmic contacts on a gan substrate using low work-function metal ytterbium (yb) and al2o3 interfacial layer

Wu, T. L., Tseng, Y. Y., Huang, C. F., Chen, Z. S., Lin, C. C., Chung, C. J., Huang, P. K. & Kao, K. H., 2019 May 1, WiPDA Asia 2019 - IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia. Institute of Electrical and Electronics Engineers Inc., 8760323. (WiPDA Asia 2019 - IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ytterbium
Ohmic contacts
Demonstrations
Metals
Annealing
12 Citations (Scopus)

Atom-Dependent Edge-Enhanced Second-Harmonic Generation on MoS2 Monolayers

Lin, K. I., Ho, Y. H., Liu, S. B., Ciou, J. J., Huang, B. T., Chen, C., Chang, H. C., Tu, C. L. & Chen, C. H., 2018 Feb 14, In : Nano letters. 18, 2, p. 793-797 5 p.

Research output: Contribution to journal › Article

Harmonic generation
Monolayers
harmonic generations
Atoms
atoms
1 Citation (Scopus)

Highly stable ITO/Zn2TiO4/Pt resistive random access memory and its application in two-bit-per-cell

Chen, S. X., Chang, S. P., Hsieh, W. K., Chang, S. J. & Lin, C. C., 2018 Jan 1, In : RSC Advances. 8, 32, p. 17622-17628 7 p.

Research output: Contribution to journal › Article

Data storage equipment
Electric potential
Zinc
Fabrication
Degradation