Fingerprint Dive into the research topics where Education and Research Group is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.

Thin films Engineering & Materials Science
Photoluminescence Engineering & Materials Science
Sputtering Engineering & Materials Science
Electric properties Engineering & Materials Science
thin films Physics & Astronomy
Oxide films Engineering & Materials Science
Substrates Engineering & Materials Science
Annealing Engineering & Materials Science

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Research Output 2002 2018

  • 37 Article
  • 14 Conference contribution
  • 5 Conference article
  • 1 Review article
7 Citations (Scopus)

Atom-Dependent Edge-Enhanced Second-Harmonic Generation on MoS2 Monolayers

Lin, K-I., Ho, Y. H., Liu, S. B., Ciou, J. J., Huang, B. T., Chen, C., Chang, H. C., Tu, C. L. & Chen, C. H., 2018 Feb 14, In : Nano letters. 18, 2, p. 793-797 5 p.

Research output: Contribution to journalArticle

Harmonic generation
Monolayers
harmonic generations
Atoms
atoms
5 Citations (Scopus)

Synthesis of Large-Area InSe Monolayers by Chemical Vapor Deposition

Chang, H. C., Tu, C. L., Lin, K-I., Pu, J., Takenobu, T., Hsiao, C. N. & Chen, C. H., 2018 Sep 27, In : Small. 14, 39, 1802351.

Research output: Contribution to journalArticle

Open Access
Indium
Chemical vapor deposition
Monolayers
Graphite
Electron mobility
1 Citation (Scopus)

The development of low-temperature atomic layer deposition of hfo2 for tem sample preparation on soft photo-resist substrate

Peng, K. P., Liu, Y. C., Lin, I. F., Lin, C-C., Huang, S. W. & Ting, C. C., 2018 Aug 30, IPFA 2018 - 25th International Symposium on the Physical and Failure Analysis of Integrated Circuits. Institute of Electrical and Electronics Engineers Inc., 8452177. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA; vol. 2018-July).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Atomic layer deposition
Hafnium
Transmission electron microscopy
Substrates
Depth profiling