Research output per year
Research output per year
- 1 - 50 out of 72 results
Search results
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2015
METHOD AND SYSTEM FOR RECOMMENDING RESEARCH INFORMATION NEWS
Chen, C-C., 2015 Jun 18, Patent No. 9213702Research output: Patent
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Method for predicting machining quality of machine tool
Cheng, F-T., 2015 May 27, Patent No. ZL 2013 1 0593639Research output: Patent
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2014
Assistance system and method for taking medicine
Tsai, P-H., 2014 Mar 13, Patent No. 9501625Research output: Patent
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ASSISTANCE SYSTEM AND METHOD FOR TAKING MEDICINE
Tsai, P-H., 2014 Mar 16, Patent No. I592152Research output: Patent
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BASELINE PREDICTIVE MAINTENANCE METHOD FOR TARGET DEVICE AND COMPUTER PROGRAM PRODUCT THEREOF
Cheng, F-T. & Wang, C-R., 2014 Feb 1, Patent No. I463334Research output: Patent
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METHOD FOR PREDICTING MACHINING QUALITY OF MACHINE TOOL
Cheng, F-T., 2014 May 8, Patent No. 9508042Research output: Patent
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Method for searching and analyzing process parameters and computer program product thereof
Cheng, F-T., 2014 Aug 16, Patent No. I549007Research output: Patent
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PILL CONTAINER AND AUXILIARY TAKING MEDICINE DEVICE
Tsai, P-H., 2014 Feb 16, Patent No. I 546073Research output: Patent
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標的裝置的基底預測保養方法與其電腦程式產品
Cheng, F-T. & Wang, C-R., 2014 Feb 12, Patent No. ZL 2013 1 0181746.2Research output: Patent
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2013
METHOD FOR SCREENING SAMPLES FOR BUILDING PREDICTION MODEL AND COMPUTER PROGRAM PRODUCT THEREOF
Cheng, F-T., 2013 Jun 20, Patent No. 8862525Research output: Patent
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2012
ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX
Cheng, F-T., 2012 Feb 16, Patent No. 特許5292602Research output: Patent
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ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX
Cheng, F-T., 2012 Feb 10, Patent No. 10-1335896Research output: Patent
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ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX
Cheng, F-T., 2012 Feb 2, Patent No. 8688256Research output: Patent
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ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX
Cheng, F-T., 2012 Mar 14, Patent No. 1205265Research output: Patent
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2011
Manufacturing execution system with virtual-metrology capabilities and manufacturing system
Cheng, F-T., 2011 Nov 23, Patent No. 1464514Research output: Patent
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Manufacturing execution system with virtual-metrology capabilities and manufacturing system including the same
Cheng, F-T., 2011 Oct 13, Patent No. 8983644Research output: Patent
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Virtual production control system and method and computer program product thereof
Cheng, F-T., 2011 Feb 17, Patent No. 8515793Research output: Patent
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2010
檢測產品品質超規與評估產品實際量測值的方法
Cheng, F-T., 2010 Jun 16, Patent No. ZL 2008 1 0181649.2Research output: Patent
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2009
System and method for automatic virtual metrology
Cheng, F-T., 2009 Jul 30, Patent No. 10-1098037Research output: Patent
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System and method for automatic virtual metrology
Cheng, F-T., 2009 Nov 26, Patent No. 8095484Research output: Patent
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System and method for automatic virtual metrology
Cheng, F-T., 2009 Jan 27, Patent No. 特許4914457Research output: Patent
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2008
Dual-phase virtual metrlogy method
Cheng, F-T., 2008 Dec 18, Patent No. 4584295Research output: Patent
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Dual-phase virtual metrlogy method
Cheng, F-T., 2008 Dec 11, Patent No. 7603328Research output: Patent
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Dual-phase virtual metrology method
Cheng, F-T., 2008 Dec 10, Patent No. 823284Research output: Patent
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2007
Method for evaluating reliance level of a virtual metrology system in product manufacturing
Cheng, F-T., 2007 Dec 6, Patent No. 7593912Research output: Patent
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2005
Generic embedded device and mechanism thereof for various intelligent-maintenance applications
Cheng, F-T., 2005 Jan 27, Patent No. 7162394Research output: Patent
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Method for providing fault-tolerant application cluster service
Cheng, F-T., 2005 Oct 27, Patent No. 7457236Research output: Patent
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Quality prognostics system and method for manufacturing processes
Cheng, F-T., 2005 Dec 29, Patent No. 7493185Research output: Patent
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六自由度微/奈米定位平台
Chen, S-L., 2005 Nov 1, IPC No. G06F-019/00, Patent No. I242736, 2004 Aug 20, Priority date 2024 Aug 19Research output: Patent
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2004
Autonomous and universal remote control scheme
Cheng, F-T., 2004 Jan 8, Patent No. 7034713Research output: Patent
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2003
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Generic service management system
Cheng, F-T., 2003 Jul 17, Patent No. 7386751Research output: Patent
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主軸熱膨脹及熱預壓抑制及動態預壓調整技術
Translated title of the contribution :主軸熱膨脹及熱預壓抑制及動態預壓調整技術 Research output: Patent
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1999
高功率雷射束之位置感測系統
Translated title of the contribution :高功率雷射束之位置感測系統 Research output: Patent
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1800
A Bin Allocation Method for Applying Point Light in Linear Light Source
Cheng, F-T., 1800, Patent No. ZL201310180988.XResearch output: Patent
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ADVANCED PROCESS CONTROL SYSTEM AND METHOD UTILIZING VIRTUAL METROLOGY WITH RELIANCE INDEX AND COMPUTER PROGRAM PRODUCT THEREOF
Cheng, F-T., 1800, Patent No. I427722Research output: Patent
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A generic software testing system and method
Cheng, F-T., 1800, Patent No. I262383Research output: Patent
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Autonomous and universal remote control scheme
Cheng, F-T., 1800, Patent No. 193295/567681Research output: Patent
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BASELINE PREDICTIVE MAINTENANCE METHOD FOR TARGET DEVICE AND COMPUTER PROGRAM PRODUCT THEREOF
Cheng, F-T. & Wang, C-R., 1800, Patent No. 10-1518448Research output: Patent
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BIN ALLOCATION METHOD OF POINT LIGHT SOURCES FOR CONSTRUCTING LIGHT SOURCE SETS AND COMPUTER PROGRAM PRODUCT THEREOF
Cheng, F-T., 1800, Patent No. I463477Research output: Patent
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COMPUTER PERFORMANCE EVALUATOR AND APPLICATION METHOD THEREOF
Cheng, F-T., 1800, Patent No. I292091Research output: Patent
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Culturing chamber on microscope stage
Cheng, F-T. & Ho, C-L., 1800, Patent No. 10259251.9Research output: Patent
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