浩志 劉

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Bernard Haochih Liu

Professor

 https://orcid.org/0000-0002-5914-5461
Calculated based on number of publications stored in Pure and citations from Scopus
20002025

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  • 2017

    Improved contact lens injection molding production by 3D printed conformal cooling channels

    Lin, Y. F., Wu, J. R., Liu, B. H., Wei, W. C. J., Wang, A. B. & Luo, R. C., 2017 Jul 2, SII 2017 - 2017 IEEE/SICE International Symposium on System Integration. Institute of Electrical and Electronics Engineers Inc., p. 89-94 6 p. (SII 2017 - 2017 IEEE/SICE International Symposium on System Integration; vol. 2018-January).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    6 Citations (Scopus)
  • 2016

    3D printing of low melting temperature alloys by fused deposition modeling

    Hsieh, P. C., Tsai, C. H., Liu, B. H., Wei, W. C. J., Wang, A. B. & Luo, R. C., 2016 May 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1138-1142 5 p. 7474915. (Proceedings of the IEEE International Conference on Industrial Technology; vol. 2016-May).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    23 Citations (Scopus)

  • Ceramic feedstocks for additive manufacturing

    Fan, N. C., Wei, W. C. J., Liu, B. H., Wang, A. B. & Luo, R. C., 2016 May 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1147-1151 5 p. 7474917. (Proceedings of the IEEE International Conference on Industrial Technology; vol. 2016-May).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    6 Citations (Scopus)

  • Cu-based alloys for 3DP by melt extrusion process

    Chou, C. S., Wei, W. C. J., Liu, B. H., Wang, A. B. & Luo, R. C., 2016 May 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1152-1157 6 p. 7474918. (Proceedings of the IEEE International Conference on Industrial Technology; vol. 2016-May).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

  • Design and test of additive manufacturing for coating thermoplastic PEEK material

    Liu, C. Y., Hsieh, Y. W., Sun, T. J., Zeng, J. W., Wang, A. B., Lee, N. T., Chau, S. W., Wei, W. C., Liu, B. H. & Luo, R. C., 2016 May 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1158-1162 5 p. 7474919. (Proceedings of the IEEE International Conference on Industrial Technology; vol. 2016-May).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    7 Citations (Scopus)

  • Glass and hot extrusion by ME module for 3D additive manufacturing

    Wang, P. W., Chou, C. S., Wei, W. C. J., Liu, B. H., Liu, A., Wang, A. B. & Luo, R. C., 2016 May 19, Proceedings - 2016 IEEE International Conference on Industrial Technology, ICIT 2016. Institute of Electrical and Electronics Engineers Inc., p. 1167-1171 5 p. 7474920. (Proceedings of the IEEE International Conference on Industrial Technology; vol. 2016-May).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    2 Citations (Scopus)
  • 2014

    Effects of temperature on surface accumulation and release of silica nanoparticles in an epoxy nanocoating exposed to UV radiation

    Tien, C. C., Chang, C. H., Liu, B. H., Stanley, D., Rabb, S. A., Yu, L. L., Nguyen, T. & Sung, L., 2014, Technical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014. Nano Science and Technology Institute, p. 101-104 4 p. (Technical Proceedings of the 2014 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2014; vol. 3).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    1 Citation (Scopus)
  • 2008

    Recent CD AFM probe developments for sub-45 nm technology nodes

    Liu, B. H., Osborne, J. R., Dahlen, G. A., Greschner, J., Bayer, T., Kalt, S. & Fritz, G., 2008 Dec 1, Metrology, Inspection, and Process Control for Microlithography XXII. 69222J. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6922).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    14 Citations (Scopus)

  • TEM validation of CD AFM image reconstruction: Part II

    Dahlen, G. A., Liu, H. C., Osborn, M., Osborne, J. R., Tracy, B. & Del Rosario, A., 2008, Metrology, Inspection, and Process Control for Microlithography XXII. 69220K. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6922).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    8 Citations (Scopus)
  • 2007

    Advanced CD-AFM probe tip shape characterization for metrology accuracy and throughput

    Liu, H. C., Osborne, J. R., Osborn, M. & Dahlen, G. A., 2007, Metrology, Inspection, and Process Control for Microlithography XXI. PART 3 ed. 65183K. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6518, no. PART 3).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    20 Citations (Scopus)

  • Measurement uncertainty in nanometrology: Leveraging attributes of TEM and CD AFM

    Liu, H. C., Dahlen, G. A., Osborn, M., Osborne, J. R., Mininni, L., Tracy, B. & Del Rosario, A., 2007, 2007 IEEE Instrumentation and Measurement Technology, IMTC 2007 - Conference Proceedings - Synergy of Science and Technology in Instrumentation and Measurement. Institute of Electrical and Electronics Engineers Inc., 4258228. (Conference Record - IEEE Instrumentation and Measurement Technology Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    4 Citations (Scopus)

  • TEM validation of CD AFM image reconstruction

    Dahlen, G. A., Mininni, L., Osborn, M., Liu, H. C., Osborne, J. R., Tracy, B. & Del Rosario, A., 2007, Metrology, Inspection, and Process Control for Microlithography XXI. PART 1 ed. 651818. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6518, no. PART 1).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    21 Citations (Scopus)
  • 2006

    Carbon nanotube AFM probes for microlithography process control

    Liu, H. C., Fong, D., Dahlen, G. A., Osborn, M., Hand, S. & Osborne, J. R., 2006 Jul 11, Metrology, Inspection, and Process Control for Microlithography XX. 61522Y. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6152 II).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    19 Citations (Scopus)

  • Critical dimension AFM tip characterization and image reconstruction applied to the 45 nm node

    Dahlen, G., Osborn, M., Liu, H. C., Jain, R., Foreman, W. & Osborne, J. R., 2006, Metrology, Inspection, and Process Control for Microlithography XX. 61522R. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6152 II).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    30 Citations (Scopus)