• 142 Citations
  • 6 h-Index
20082020
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Fingerprint Dive into the research topics where Chang-Fu Han is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 3 Similar Profiles
Nanoindentation Engineering & Materials Science
Optical properties Engineering & Materials Science
Substrates Engineering & Materials Science
Electric properties Engineering & Materials Science
Ball bearings Engineering & Materials Science
Indentation Engineering & Materials Science
Polyethylene terephthalates Engineering & Materials Science
Polyethylene Terephthalates Chemical Compounds

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Research Output 2008 2020

  • 142 Citations
  • 6 h-Index
  • 29 Article
  • 3 Conference contribution

Effects of fluorination of carbon film and annealing conditions on side leakage current and current breakdown time of SiO2/graphene/Cu/Ti/SiO2/Si specimens

Chang, C. S., Cheng, H. C., Han, C. F., Lai, C. S. & Lin, J. F., 2020 Feb, In : Vacuum. 172, 109037.

Research output: Contribution to journalArticle

Fluorination
fluorination
Graphite
Carbon films
Leakage currents
ball bearings
Ball bearings
coefficient of friction
Entropy
Wear of materials
Carrier mobility
Carrier concentration
Electric properties
Optical properties
Glass
2 Citations (Scopus)

Effects of groove factor and surface roughness of raceway in ball-bearing-like specimens on tribological behavior and the onsets of two instabilities of dry contacts

Han, C. F., Chu, H. Y., Luo, R. Y., Liao, N. T., Wei, C. C., Chen, G. L., Tsai, P. H., Chiu, Y. L., Hwang, Y. C. & Lin, J. F., 2018 Jul 15, In : Wear. 406-407, p. 126-139 14 p.

Research output: Contribution to journalArticle

ball bearings
Ball bearings
grooves
surface roughness
slip
1 Citation (Scopus)

Effects of SiO 2 film thickness and operating temperature on thermally-induced failures in through-silicon-via structures

Han, C. F., Guo, Y. Z., Chung, C. J., Shen, C. H. & Lin, J. F., 2018 Apr 1, In : Microelectronics Reliability. 83, p. 1-13 13 p.

Research output: Contribution to journalArticle

Silicon
operating temperature
Film thickness
film thickness
silicon