Projects per year
Personal profile
Education
- 2012 PhD, Krannert School of Management, Purdue University
Research Interests
- Experimental Design
- Quality Engineering and Management
- Reliability Engineering
Experience
- 2012/08 ~ 2014/07 Assistant Professor, Department of Industrial Engineering and Management, Yuan Ze University
- 2014/08~ present Assistant Professor, Department of Industrial Information Managrment Institute of Information Management, National Cheng Kung University
Fingerprint
Dive into the research topics where Cheng-Hung Hu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Projects
- 5 Finished
Research output
- 9 Article
-
Optimum degradation test plan under model mis-specification for Wiener and gamma processes
Hu, C. H., 2023, In: Communications in Statistics: Simulation and Computation. 52, 5, p. 1719-1732 14 p.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Optimum degradation test sampling plan for the Wiener process
Hu, C. H. & Huang, C. Y., 2023 Feb, In: Quality and Reliability Engineering International. 39, 1, p. 268-282 15 p.Research output: Contribution to journal › Article › peer-review
-
Mis-specification analyses and optimum degradation test plan for Wiener and inverse Gaussian processes
Yang, C. H., Hsu, Y. H. & Hu, C. H., 2022, (Accepted/In press) In: Communications in Statistics - Theory and Methods.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Comparison among several commonly used sampling methods for a degradation test
Hu, C. H. & Lee, M. Y., 2018 Apr, In: Quality and Reliability Engineering International. 34, 3, p. 436-458 23 p.Research output: Contribution to journal › Article › peer-review
-
A two-stage latent variable estimation procedure for time-censored accelerated degradation tests
Lee, M. Y., Hu, C. H. & Tang, J., 2017 Dec, In: IEEE Transactions on Reliability. 66, 4, p. 1266-1279 14 p.Research output: Contribution to journal › Article › peer-review
8 Citations (Scopus)