Cheng-Wen Wu

Professor

  • 4195 Citations
  • 34 h-Index
1985 …2019
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Personal profile

Education

  • 1987 Ph.D., Department of ECE, UCSB
  • 1985 M. S., Department of ECE, UCSB
  • 1981 B. S., Electrical Engineering, National Taiwan University, Taipei, Taiwan, R.O.C.

Research Interests

  • Design and test of VLSI circuits and systems
  • Semiconductor memory test and repair
  • Symbiotic neuromorphic computing for IOT

Experience

  • 2019/8- 迄今 國立成功大學電機工程學系教授兼副校長
  • 2019/1-2019/12 工研院顧問(前瞻指導委員會委員)
  • 2018/1-現在 經濟部4G智慧寬頻應用程式專業審查會總召集人
  • 2017/5-2017/10 行政院科技會報首席評議專家室主任
  • 2016/8 清華大學積體電路設計技術研發中心主任
  • 2015-2016 教育部顧問
  • 2014 新竹市台大校友會理事長;台灣省台大校友會理事;台大校友總會理事
  • 2014-2016 台灣精密工程學會理事
  • 2014-2017/5 經濟部4G智慧寬頻應用城市專業審查會總召集人
  • 2014/2-2016/7 清華大學副校長(研究)
  • 2014/2 清華大學清華特聘講座教授
  • 2014/2 工研院資訊與通訊研究所特聘專家
  • 2010/1-2014/1 工研院資訊與通訊研究所所長
  • 2010-2014 智慧電子系統國家型科技計畫規劃委員、顧問
  • 2007/2-2014/1 臺灣半導體產業協會(TSIA)設計委員會主任委員
  • 2007/2-2009/12 臺灣SOC推動聯盟會長
  • 2007/2-2009/12 工研院系統晶片科技中心主任
  • 2006/2-2014/1 清華大學清華講座教授
  • 2006-2007 國科會晶片系統國家型科技計畫領域召集人
  • 2005 教育部顧問室SOC總聯盟召集人
  • 2004/2-2007/1 清華大學電機資訊學院院長
  • 2002-2014 臺灣IC設計學會理事、監事
  • 2006-2008 矽導計畫晶片系統國家型科技計畫分項顧問
  • 2001-2005 矽導計畫晶片系統國家型科技計畫分項召集人
  • 2002-2005 經濟部技審會技審委員
  • 2001-2014 國科會國家晶片系統設計中心(CIC)諮議委員
  • 2001-2004 教育部顧問室EDA聯盟召集人
  • 2000 教育部顧問室EDA聯盟執行祕書
  • 2001-2007 工研院系統晶片中心顧問
  • 2000-2006 IEEE Taipei Section理事
  • 2000/8-2003/7 清華大學電機系主任
  • 2000/10-2005/1 清華大學積體電路設計技術研發中心主任
  • 1998/3-1999/7 清華大學技術服務中心主任
  • 1996/2-1998/2 清華大學計算機中心主任
  • 1994/8 清華大學電機系教授
  • 1994-1995 工研院電通所設計自動化發展部顧問
  • 1991-1992 交通部電信研究所顧問
  • 1988/3-1994/7 清華大學電機系副教授
  • 1983-1984 行政院衛生署環境保護局技士(系統程式設計)
  • 1983 教育部公費留考 資訊工程學門 第一名
  • 1982 高考電機技師及格
  • 1981-1983 海軍通信電子學校少尉教官

Fingerprint Dive into the research topics where Cheng-Wen Wu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 22 Similar Profiles
Data storage equipment Engineering & Materials Science
Built-in self test Engineering & Materials Science
Testing Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Repair Engineering & Materials Science
Redundancy Engineering & Materials Science
Static random access storage Engineering & Materials Science
Costs Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1985 2019

A Self-Organizing Map-Based Adaptive Traffic Light Control System with Reinforcement Learning

Kao, Y. C. & Wu, C. W., 2019 Feb 19, Conference Record of the 52nd Asilomar Conference on Signals, Systems and Computers, ACSSC 2018. Matthews, M. B. (ed.). IEEE Computer Society, p. 2060-2064 5 p. 8645125. (Conference Record - Asilomar Conference on Signals, Systems and Computers; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Self organizing maps
Reinforcement learning
Telecommunication traffic
Control systems
Learning systems

Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits

Marinissen, E. J., Fodor, F., Podpod, A., Stucchi, M., Jian, Y. R. & Wu, C. W., 2019 Jan 23, International Test Conference 2018, ITC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8624731. (Proceedings - International Test Conference; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated Circuits
Integrated circuits
Die
Probe
Wafer

A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit

Chen, M. C., Wu, T. H. & Wu, C. W., 2018 Dec 6, Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018. IEEE Computer Society, p. 19-24 6 p. 8567404. (Proceedings of the Asian Test Symposium; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Built-in self test
Static random access storage
Defects
Networks (circuits)
Transistors

An enhanced boundary scan architecture for inter-die interconnect leakage measurement in 2.5D and 3D packages

Law, P. M. P., Wu, C. W., Lin, L. Y. & Hong, H. C., 2018 Jan 24, Proceedings - 2017 IEEE 26th Asian Test Symposium, ATS 2017. IEEE Computer Society, p. 1-6 6 p. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Leakage currents
Packaging
Defects
Fans
Built-in self test

RRAM-based neuromorphic hardware reliability improvement by self-healing and error correction

Hu, J. Y., Hou, K. W., Lo, C. Y., Chou, Y. F. & Wu, C. W., 2018 Sep 11, Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018. Institute of Electrical and Electronics Engineers Inc., p. 19-24 6 p. 8462942. (Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Error correction
Memristors
Neural networks
Hardware
Degradation