• 2268 Citations
  • 27 h-Index
1983 …2021

Research output per year

If you made any changes in Pure these will be visible here soon.

Research Output

Filter
Conference contribution
2018

A Cloud-based Pluggable Manufacturing Service Scheme for Smart Factory

Liu, Y. Y., Hung, M. H., Lin, Y. C., Chen, C. C., Gao, W. L. & Cheng, F. T., 2018 Dec 4, 2018 IEEE 14th International Conference on Automation Science and Engineering, CASE 2018. IEEE Computer Society, p. 1040-1045 6 p. 8560401. (IEEE International Conference on Automation Science and Engineering; vol. 2018-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
2016

A hybrid tool life prediction scheme in cloud architecture

Yang, H. C., Li, Y. Y., Wu, M. N. & Cheng, F. T., 2016 Nov 14, 2016 IEEE International Conference on Automation Science and Engineering, CASE 2016. IEEE Computer Society, p. 1160-1165 6 p. 7743536. (IEEE International Conference on Automation Science and Engineering; vol. 2016-November).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)
2015

Development of a novel cloud-based multi-tenant model creation scheme for machine tools

Lin, Y. C., Hung, M. H., Wei, C. F. & Cheng, F. T., 2015 Oct 7, 2015 IEEE Conference on Automation Science and Engineering: Automation for a Sustainable Future, CASE 2015. IEEE Computer Society, p. 1448-1449 2 p. 7294302. (IEEE International Conference on Automation Science and Engineering; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Extracting relevant features for diagnosing machine tool faults in cloud architecture

Li, Y. Y., Yang, H. C., Tieng, H. & Cheng, F. T., 2015 Oct 7, 2015 IEEE Conference on Automation Science and Engineering: Automation for a Sustainable Future, CASE 2015. IEEE Computer Society, p. 1434-1439 6 p. 7294299. (IEEE International Conference on Automation Science and Engineering; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Total precision inspection of machine tools with virtual metrology

Tieng, H., Yang, H. C. & Cheng, F. T., 2015 Oct 7, 2015 IEEE Conference on Automation Science and Engineering: Automation for a Sustainable Future, CASE 2015. IEEE Computer Society, p. 1446-1447 2 p. 7294301. (IEEE International Conference on Automation Science and Engineering; vol. 2015-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2013

A novel virtual metrology scheme for predicting machining precision of machine tools

Tieng, H., Yang, H. C., Hung, M. H. & Cheng, F. T., 2013 Nov 14, 2013 IEEE International Conference on Robotics and Automation, ICRA 2013. p. 264-269 6 p. 6630586. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)

Automatic baseline-sample-selection scheme for baseline predictive maintenance

Chen, C. F., Hsieh, Y. S., Cheng, F. T., Huang, H. C. & Wang, S. C., 2013 Dec 1, 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013. p. 183-188 6 p. 6653934. (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Development of an advanced manufacturing cloud for machine tool industry based on AVM technology

Hung, M. H., Lin, Y. C., Huang, H. C., Hsieh, M. H., Yang, H. C. & Cheng, F. T., 2013 Dec 1, 2013 IEEE International Conference on Automation Science and Engineering, CASE 2013. p. 189-194 6 p. 6654048. (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Preliminary study of advanced fault detection scheme

Shih, Y. H., Huang, Y. T. & Cheng, F-T., 2013 Nov 14, 2013 IEEE International Conference on Robotics and Automation, ICRA 2013. p. 3561-3566 6 p. 6631076. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2012

A dual-forecast scheme for production output with paired/unpaired WIP data

Yang, H. C., Tsai, T. H., Chao, C. Y., Hung, M. H. & Cheng, F. T., 2012 Dec 1, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. p. 581-586 6 p. 6386467. (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A key parameter analysis-and-selection system "eProcessKey"

Kao, C. A., Cheng, C. H. & Cheng, F-T., 2012 Dec 20, 2012 e-Manufacturing and Design Collaboration Symposium, eMDC 2012. 6338423. (2012 e-Manufacturing and Design Collaboration Symposium, eMDC 2012).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

An optimal LED bin allocation system based on multi-level integer programming method

Yang, H. C., Tsai, T. H., Chen, H. W. & Cheng, F-T., 2012 Jan 1, 2012 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2012. IEEE Computer Society, p. 1223-1227 5 p. 6837938. (IEEE International Conference on Industrial Engineering and Engineering Management).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A virtual-metrology-based machining state conjecture system

Yang, H. C., Tieng, H., Li, Y. Y., Hung, M. H. & Cheng, F. T., 2012 Oct 5, AIM 2012 - 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Conference Digest. p. 462-466 5 p. 6265901. (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Development of a cloud-computing-based equipment monitoring system for machine tool industry

Hung, M. H., Lin, Y. C., Quoc Huy, T., Yang, H. C. & Cheng, F. T., 2012 Dec 1, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. p. 962-967 6 p. 6386500. (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

New remote monitoring and control system architectures based on cloud computing

Cheng, J. Y., Hung, M. H., Lin, S. S. & Cheng, F. T., 2012 Nov 26, Advanced Manufacturing Focusing on Multi-Disciplinary Technologies. p. 312-329 18 p. (Advanced Materials Research; vol. 579).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Preliminary study of a dynamic-moving-window scheme for virtual-metrology model refreshing

Wu, W. M., Cheng, F. T. & Hung, M. H., 2012 Jan 1, 2012 IEEE International Conference on Robotics and Automation, ICRA 2012. Institute of Electrical and Electronics Engineers Inc., p. 5044-5049 6 p. 6224633. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Refinement of kernel and functional mechanisms for automatic virtual metrology system

Hung, M. H., Chen, C. F., Lin, Y. C., Chou, M. Y. & Cheng, F. T., 2012 Oct 5, AIM 2012 - 2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Conference Digest. p. 472-477 6 p. 6265954. (IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Virtual-metrology-based FDC scheme

Hsieh, Y. S., Cheng, F. T. & Yang, H. C., 2012 Dec 1, 2012 IEEE International Conference on Automation Science and Engineering: Green Automation Toward a Sustainable Society, CASE 2012. p. 80-85 6 p. 6386371. (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2011

Preliminary study of run-to-run control utilizing virtual metrology with reliance index

Kao, C. A., Cheng, F. T. & Wu, W. M., 2011 Dec 5, 2011 IEEE International Conference on Automation Science and Engineering, CASE 2011. p. 256-261 6 p. 6042446. (IEEE International Conference on Automation Science and Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Run-to-run control utilizing the AVM system in the solar industry

Lin, L. R., Chiu, Y. C., Mo, W. C., Kao, C. A., Liu, T. M., Zeng, D. L. & Cheng, F. T., 2011 Dec 22, 2011 e-Manufacturing and Design Collaboration Symposium and International Symposium on Semiconductor Manufacturing, eMDC and ISSM 2011. 6086044. (IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)
2010

Configuring AVM as a MES componConfiguring AVM as a MES component

Cheng, F. T., Chang, J. Y. C., Kao, C. A., Chen, Y. L. & Peng, J. L., 2010 Oct 11, 2010 IEEE/SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2010. p. 226-231 6 p. 5551454. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Developing a dual-stage indirect virtual metrology architecture

Tsai, W. H., Cheng, F-T., Wu, W. M. & Lin, T. H., 2010 Aug 26, 2010 IEEE International Conference on Robotics and Automation, ICRA 2010. p. 2107-2112 6 p. 5509719. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Development of an automatic virtual metrology framework for TFT-LCD industry

Hung, M. H., Huang, H. C., Yang, H. C. & Cheng, F. T., 2010 Nov 17, 2010 IEEE International Conference on Automation Science and Engineering, CASE 2010. p. 879-884 6 p. 5584541. (2010 IEEE International Conference on Automation Science and Engineering, CASE 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Virtual production control system

Yang, H. C., Chen, Y. L., Hung, M. H. & Cheng, F. T., 2010 Nov 17, 2010 IEEE International Conference on Automation Science and Engineering, CASE 2010. p. 984-989 6 p. 5584297. (2010 IEEE International Conference on Automation Science and Engineering, CASE 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)
2009

Advanced studies of selection schemes for dual virtual-metrology outputs

Wu, W. M., Cheng, F-T., Lin, T. H., Zeng, D. L., Chen, J. F. & Hung, M. H., 2009 Nov 12, 2009 IEEE International Conference on Automation Science and Engineering, CASE 2009. p. 421-426 6 p. 5234137. (2009 IEEE International Conference on Automation Science and Engineering, CASE 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Developing a product quality fault detection scheme

Huang, Y. T., Cheng, F. T. & Hung, M. H., 2009 Nov 2, 2009 IEEE International Conference on Robotics and Automation, ICRA '09. p. 927-932 6 p. 5152474. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)
2008

A novel key-variable sifting algorithm for virtual metrology

Lin, T. H., Cheng, F. T., Ye, A. J., Wu, W. M. & Hung, M. H., 2008 Sep 18, 2008 IEEE International Conference on Robotics and Automation, ICRA 2008. p. 3636-3641 6 p. 4543768. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Automatic virtual metrology system design and implementation

Huang, Y. T., Huang, H. C., Cheng, F. T., Liao, T. S. & Chang, F. C., 2008 Nov 3, 4th IEEE Conference on Automation Science and Engineering, CASE 2008. p. 223-229 7 p. 4626524. (4th IEEE Conference on Automation Science and Engineering, CASE 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

Developing a selection scheme for dual virtual-metrology outputs

Wu, W. M., Cheng, F. T., Zeng, D. L., Lin, T. H. & Chen, J. F., 2008 Nov 3, 4th IEEE Conference on Automation Science and Engineering, CASE 2008. p. 230-235 6 p. 4626525. (4th IEEE Conference on Automation Science and Engineering, CASE 2008).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Development of a dual-stage virtual metrology architecture for TFT-LCD manufacturing

Su, Y. C., Tsai, W. H., Cheng, F. T. & Wu, W. M., 2008 Sep 18, 2008 IEEE International Conference on Robotics and Automation, ICRA 2008. p. 3630-3635 6 p. 4543767. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2007

Development of a dual-phase virtual metrology scheme

Cheng, F. T., Huang, H. C. & Kao, C. A., 2007 Dec 1, Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007. p. 270-275 6 p. 4341679. (Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Development of a generic virtual metrology framework

Huang, H. C., Su, Y. C., Cheng, F. T. & Jian, J. M., 2007 Dec 1, Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007. p. 282-287 6 p. 4341746. (Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Implementation considerations of various virtual metrology algorithms

Su, Y. C., Lin, T. H., Cheng, F. T. & Wu, W. M., 2007 Dec 1, Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007. p. 276-281 6 p. 4341740. (Proceedings of the 3rd IEEE International Conference on Automation Science and Engineering, IEEE CASE 2007).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Citations (Scopus)

Method for evaluating reliance level of a virtual metrology system

Cheng, F. T., Chen, Y. T., Su, Y. C. & Zeng, D. L., 2007 Nov 27, 2007 IEEE International Conference on Robotics and Automation, ICRA'07. p. 1590-1596 7 p. 4209315. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Novel semiconductor business model - Engineering chain for the semiconductor industry

Chang, J. Y. C., Cheng, F-T. & Wang, T. L., 2007 Nov 27, 2007 IEEE International Conference on Robotics and Automation, ICRA'07. p. 1597-1602 6 p. 4209316. (Proceedings - IEEE International Conference on Robotics and Automation).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)
2006

A virtual metrology scheme for predicting CVD thickness in semiconductor manufacturing

Lin, T. H., Hung, M. H., Lin, R. C. & Cheng, F. T., 2006 Dec 27, Proceedings 2006 IEEE International Conference on Robotics and Automation, ICRA 2006. p. 1054-1059 6 p. 1641849. (Proceedings - IEEE International Conference on Robotics and Automation; vol. 2006).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

25 Citations (Scopus)

Importance of data quality in virtual metrology

Huang, Y. T., Cheng, F-T. & Chen, Y. T., 2006 Dec 1, IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics. p. 3727-3732 6 p. 4153229. (IECON Proceedings (Industrial Electronics Conference)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Citations (Scopus)

Manufacturability of multivariate applications in the semiconductor industry

Jonathan, C. Y. C. & Cheng, F. T., 2006 Jan 1, 2006 IEEE International Conference on Automation Science and Engineering, CASE. Institute of Electrical and Electronics Engineers Inc., p. 230-235 6 p. 4120351. (2006 IEEE International Conference on Automation Science and Engineering, CASE).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Multivariate simulation assessment for virtual metrology

Chen, Y. T., Yang, H. C. & Cheng, F. T., 2006 Dec 27, Proceedings 2006 IEEE International Conference on Robotics and Automation, ICRA 2006. p. 1048-1053 6 p. 1641848. (Proceedings - IEEE International Conference on Robotics and Automation; vol. 2006).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Citations (Scopus)
2005

Application cluster service scheme for near-zero-downtime services

Cheng, F-T., Wu, S. L., Tsai, P. Y., Chung, Y. T. & Yang, H. C., 2005 Dec 1, Proceedings of the 2005 IEEE International Conference on Robotics and Automation. p. 4062-4067 6 p. 1570743. (Proceedings - IEEE International Conference on Robotics and Automation; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Application development of virtual metrology in semiconductor industry

Jonathan, C. Y. C. & Cheng, F-T., 2005 Dec 1, IECON 2005: 31st Annual Conference of IEEE Industrial Electronics Society. p. 124-129 6 p. 1568891. (IECON Proceedings (Industrial Electronics Conference); vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

53 Citations (Scopus)

A secure collaborative e-Diagnostics framework for semiconductor factories

Hung, M. H., Hsu, F. Y., Wang, T. L., Cheng, F. T., Lai, R. & Huang, T., 2005 Dec 1, Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005. p. 185-190 6 p. 1506766. (Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Design and implementation of an intelligent prognostics system

Su, Y. C., Cheng, F. T., Hung, M. H., Lin, Y. C. & Lin, R. C., 2005 Dec 1, Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005. p. 273-278 6 p. 1506781. (Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Development of a data pre-processing scheme and pluggable application modules for an intelligent equipment prognostics system

Su, Y. C., Hung, M. H., Cheng, F. T. & Lee, T. P., 2005 Dec 1, Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. p. 38-43 6 p. 1560349. (2005 3rd IEEE International Conference on Industrial Informatics, INDIN; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Engineering-chain requirements for semiconductor industry

Cheng, J. C. Y. & Cheng, F-T., 2005 Dec 1, Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005. p. 381-386 6 p. 1506799. (Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Framework development of an engineering-chain-management-system for the semiconductor industry

Chang, J. Y. C. & Cheng, F. T., 2005 Dec 1, Proceedings - Thirteenth International Symposium on Temporal Representation and Reasoning, TIME 2006. p. 306-311 6 p. 1560394. (2005 3rd IEEE International Conference on Industrial Informatics, INDIN; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)
2004

An e-diagnostics framework with security considerations for semiconductor factories

Hung, M. H., Ho, R. W. & Cheng, F. T., 2004 Dec 1, 2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW. p. 37-40 4 p. (2004 Semiconductor Manufacturing Technology Workshop Proceedings, SMTW).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
1999

Development of a generic equipment manager for semiconductor manufacturing

Yang, H. C., Cheng, F-T. & Huang, D., 1999, IEEE Symposium on Emerging Technologies and Factory Automation, ETFA. IEEE, Vol. 1. p. 727-732 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)
1998

Development of a distributed object-oriented system framework for the computer-integrated manufacturing execution system

Cheng, F. T., Shen, E., Deng, J. Y. & Nguyen, K., 1998, Proceedings - 1998 IEEE International Conference on Robotics and Automation, ICRA 1998. Institute of Electrical and Electronics Engineers Inc., p. 2116-2121 6 p. 680633. (Proceedings - IEEE International Conference on Robotics and Automation; vol. 3).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

20 Citations (Scopus)

Solving the optimal force distribution problem in vehicles

Chen, J. S., Cheng, F. T., Yang, K. T., Kung, F. C. & Sun, Y. Y., 1998 Jan 1, Proceedings - 1998 IEEE International Conference on Robotics and Automation, ICRA 1998. Institute of Electrical and Electronics Engineers Inc., p. 471-476 6 p. 677019. (Proceedings - IEEE International Conference on Robotics and Automation; vol. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)