• 2268 Citations
  • 27 h-Index
1983 …2021

Research output per year

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Research Output

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Article
2020

An automated dynamic-balancing-inspection scheme for wheel machining

Tieng, H., Li, Y. Y., Tseng, K. P., Yang, H. C. & Cheng, F. T., 2020 Apr, In : IEEE Robotics and Automation Letters. 5, 2, p. 2224-2231 8 p., 8978473.

Research output: Contribution to journalArticle

2019

A Gradual Refreshing Scheme for Improving Tool Utilization

Yang, H. C., Tsai, T. H., Tieng, H. & Cheng, F. T., 2019 Apr, In : IEEE Robotics and Automation Letters. 4, 2, p. 515-522 8 p., 8605344.

Research output: Contribution to journalArticle

An Intelligent Metrology Architecture with AVM for Metal Additive Manufacturing

Yang, H. C., Adnan, M., Huang, C. H., Cheng, F. T., Lo, Y. L. & Hsu, C. H., 2019 Jul, In : IEEE Robotics and Automation Letters. 4, 3, p. 2886-2893 8 p., 8733865.

Research output: Contribution to journalArticle

A Novel Efficient Big Data Processing Scheme for Feature Extraction in Electrical Discharge Machining

Chen, C. C., Hung, M. H., Suryajaya, B., Lin, Y. C., Yang, H. C., Huang, H. C. & Cheng, F. T., 2019 Apr, In : IEEE Robotics and Automation Letters. 4, 2, p. 910-917 8 p., 8605347.

Research output: Contribution to journalArticle

Automatic Virtual Metrology for Carbon Fiber Manufacturing

Hsieh, Y. M., Lin, C. Y., Yang, Y. R., Hung, M. H. & Cheng, F. T., 2019 Jul, In : IEEE Robotics and Automation Letters. 4, 3, p. 2730-2737 8 p., 8716511.

Research output: Contribution to journalArticle

Time Series Prediction Algorithm for Intelligent Predictive Maintenance

Lin, C. Y., Hsieh, Y. M., Cheng, F. T., Huang, H. C. & Adnan, M., 2019 Jul, In : IEEE Robotics and Automation Letters. 4, 3, p. 2807-2814 8 p., 8721101.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2018

A Novel Automated Construction Scheme for Efficiently Developing Cloud Manufacturing Services

Chen, C. C., Hung, M. H., Li, P. Y., Lin, Y. C., Liu, Y. Y. & Cheng, F. T., 2018 Jul, In : IEEE Robotics and Automation Letters. 3, 3, p. 1378-1385 8 p.

Research output: Contribution to journalArticle

3 Citations (Scopus)

Automatic Virtual Metrology and Deformation Fusion Scheme for Engine-Case Manufacturing

Tieng, H., Tsai, T. H., Chen, C. F., Yang, H. C., Huang, J. W. & Cheng, F. T., 2018 Apr, In : IEEE Robotics and Automation Letters. 3, 2, p. 934-941 8 p., 8255616.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Interaction-Effect Search Algorithm for the KSA Scheme

Lin, C. Y., Hsieh, Y. M., Cheng, F. T., Yang, Y. R. & Adnan, M., 2018 Oct, In : IEEE Robotics and Automation Letters. 3, 4, p. 2778-2785 8 p.

Research output: Contribution to journalArticle

2017
3 Citations (Scopus)

A scheme of high-dimensional key-variable search algorithms for yield improvement

Cheng, F. T., Hsieh, Y. S., Zheng, J. W., Chen, S. M., Xiao, R. X. & Lin, C. Y., 2017 Jan, In : IEEE Robotics and Automation Letters. 2, 1, p. 179-186 8 p., 7498656.

Research output: Contribution to journalArticle

6 Citations (Scopus)

Automatic Virtual Metrology and Target Value Adjustment for Mass Customization

Tieng, H., Chen, C. F., Cheng, F. T. & Yang, H. C., 2017 Apr, In : IEEE Robotics and Automation Letters. 2, 2, p. 546-553 8 p., 7801027.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Blind-Stage Search Algorithm for the Key-Variable Search Scheme

Cheng, F. T., Lin, C. Y., Chen, C. F., Xiao, R. X., Zheng, J. W. & Hsieh, Y. S., 2017 Oct, In : IEEE Robotics and Automation Letters. 2, 4, p. 1840-1847 8 p., 7934071.

Research output: Contribution to journalArticle

1 Citation (Scopus)
12 Citations (Scopus)

Development of Advanced Manufacturing Cloud of Things (AMCoT)-A Smart Manufacturing Platform

Lin, Y. C., Hung, M. H., Huang, H. C., Chen, C. C., Yang, H. C., Hsieh, Y. S. & Cheng, F. T., 2017 Jul, In : IEEE Robotics and Automation Letters. 2, 3, p. 1809-1816 8 p., 7932169.

Research output: Contribution to journalArticle

34 Citations (Scopus)

Development of a novel cloud-based multi-tenant model creation service for automatic virtual metrology

Hung, M. H., Li, Y. Y., Lin, Y. C., Wei, C. F., Yang, H. C. & Cheng, F. T., 2017 Apr 1, In : Robotics and Computer-Integrated Manufacturing. 44, p. 174-189 16 p.

Research output: Contribution to journalArticle

6 Citations (Scopus)
2016

A novel cloud manufacturing framework with auto-scaling capability for the machining industry

Chen, C. C., Lin, Y. C., Hung, M. H., Lin, C. Y., Tsai, Y. J. & Cheng, F. T., 2016 Jul 2, In : International Journal of Computer Integrated Manufacturing. 29, 7, p. 786-804 19 p.

Research output: Contribution to journalArticle

10 Citations (Scopus)

Automated sampling decision scheme for the AVM system

Cheng, F. T., Hsieh, Y. S., Chen, C. F. & Lyu, J. R., 2016 Nov 1, In : International Journal of Production Research. 54, 21, p. 6351-6366 16 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Automatic virtual metrology for wheel machining automation

Yang, H. C., Tieng, H. & Cheng, F. T., 2016 Nov 1, In : International Journal of Production Research. 54, 21, p. 6367-6377 11 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)

Industry 4.1 for Wheel Machining Automation

Cheng, F. T., Tieng, H., Yang, H. C., Hung, M. H., Lin, Y. C., Wei, C. F. & Shieh, Z. Y., 2016 Jan, In : IEEE Robotics and Automation Letters. 1, 1, p. 332-339 8 p., 7378846.

Research output: Contribution to journalArticle

19 Citations (Scopus)
10 Citations (Scopus)
2015

CASE 2014 [Society News]

Luo, R. C. & Cheng, F. T., 2015 Jan 1, In : IEEE Robotics and Automation Magazine. 22, 1, p. 130-131 2 p., 7059272.

Research output: Contribution to journalArticle

Development of cloud-based automatic virtual metrology system for semiconductor industry

Huang, H. C., Lin, Y. C., Hung, M. H., Tu, C. C. & Cheng, F. T., 2015 Aug, In : Robotics and Computer-Integrated Manufacturing. 34, p. 30-43 14 p.

Research output: Contribution to journalArticle

13 Citations (Scopus)

Intelligent sampling decision scheme based on the AVM system

Cheng, F. T., Chen, C. F., Hsieh, Y. S., Huang, H. H. & Wu, C. C., 2015 Apr 3, In : International Journal of Production Research. 53, 7, p. 2073-2088 16 p.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Tutorial on applying the VM technology for TFT-LCD manufacturing

Cheng, F-T., Kao, C. A., Chen, C. F. & Tsai, W. H., 2015 Feb 1, In : IEEE Transactions on Semiconductor Manufacturing. 28, 1, p. 55-69 15 p., 6983605.

Research output: Contribution to journalArticle

18 Citations (Scopus)
2014
6 Citations (Scopus)
2013

Applying the Automatic Virtual Metrology system to obtain tube-to-tube control in a PECVD tool

Cheng, F. T. & Chiu, Y. C., 2013 Jun 1, In : IIE Transactions (Institute of Industrial Engineers). 45, 6, p. 670-681 12 p.

Research output: Contribution to journalArticle

7 Citations (Scopus)

Run-to-run control utilizing virtual metrology with reliance index

Kao, C. A., Cheng, F. T., Wu, W. M., Kong, F. W. & Huang, H. H., 2013 Feb 11, In : IEEE Transactions on Semiconductor Manufacturing. 26, 1, p. 69-81 13 p., 6357325.

Research output: Contribution to journalArticle

19 Citations (Scopus)

VM-based baseline predictive maintenance scheme

Hsieh, Y. S., Cheng, F. T., Huang, H. C., Wang, C. R., Wang, S. C. & Yang, H. C., 2013 Feb 11, In : IEEE Transactions on Semiconductor Manufacturing. 26, 1, p. 132-144 13 p., 6304937.

Research output: Contribution to journalArticle

13 Citations (Scopus)
2012

A novel automatic virtual metrology system architecture for TFT-LCD industry based on main memory database

Hung, M. H., Tsai, W. H., Yang, H. C., Kao, Y. J. & Cheng, F. T., 2012 Aug 1, In : Robotics and Computer-Integrated Manufacturing. 28, 4, p. 559-568 10 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)

Design and implementation of a data exchange platform for TFT-LCD virtual production control systems

Hung, M. H., Lin, Y. C., Li, S. H., Yang, H. C. & Cheng, F. T., 2012, In : International Journal of Automation and Smart Technology. 2, 2, p. 83-94 12 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Developing an automatic virtual metrology system

Cheng, F. T., Huang, H. C. & Kao, C. A., 2012 Jan 1, In : IEEE Transactions on Automation Science and Engineering. 9, 1, p. 181-188 8 p., 6051498.

Research output: Contribution to journalArticle

55 Citations (Scopus)

Development of an AVM System Implementation Framework

Hung, M. H., Chen, C. F., Huang, H. C., Yang, H. C. & Cheng, F. T., 2012 Nov, In : IEEE Transactions on Semiconductor Manufacturing. 25, 4, p. 598-613 16 p.

Research output: Contribution to journalArticle

9 Citations (Scopus)

Dynamic-moving-window scheme for virtual-metrology model refreshing

Wu, W. M., Cheng, F. T. & Kong, F. W., 2012 May 11, In : IEEE Transactions on Semiconductor Manufacturing. 25, 2, p. 238-246 9 p., 6126059.

Research output: Contribution to journalArticle

14 Citations (Scopus)

Engineering chain: A novel semiconductor engineering collaboration model

Cheng, F. T., Chen, Y. L. & Chang, J. Y. C., 2012 Aug 13, In : IEEE Transactions on Semiconductor Manufacturing. 25, 3, p. 394-407 14 p., 6117097.

Research output: Contribution to journalArticle

4 Citations (Scopus)
2011

Automatic data quality evaluation for the AVM system

Huang, Y. T. & Cheng, F. T., 2011 Aug 1, In : IEEE Transactions on Semiconductor Manufacturing. 24, 3, p. 445-454 10 p., 5766761.

Research output: Contribution to journalArticle

30 Citations (Scopus)

Benefit model of virtual metrology and integrating AVM into MES

Cheng, F. T., Chang, J. Y. C., Huang, H. C., Kao, C. A., Chen, Y. L. & Peng, J. L., 2011 May 1, In : IEEE Transactions on Semiconductor Manufacturing. 24, 2, p. 261-272 12 p., 5682063.

Research output: Contribution to journalArticle

32 Citations (Scopus)

Selection schemes of dual virtual-metrology outputs for enhancing prediction accuracy

Wu, W. M., Cheng, F. T., Lin, T. H., Zeng, D. L. & Chen, J. F., 2011 Apr 1, In : IEEE Transactions on Automation Science and Engineering. 8, 2, p. 311-318 8 p., 5634122.

Research output: Contribution to journalArticle

16 Citations (Scopus)
2010

Advanced E-manufacturing model: The significance of large-scale, distributed, and object-oriented systems

Cheng, F. T., Tsai, W. H., Wang, T. L., Yung-Cheng Chang, J. & Su, Y. C., 2010 Mar 1, In : IEEE Robotics and Automation Magazine. 17, 1, p. 71-84 14 p., 5430394.

Research output: Contribution to journalArticle

12 Citations (Scopus)

An efficient data exchange scheme for semiconductor engineering chain management system

Hunga, M. H., Wu, S. W., Wang, T. L., Cheng, F. T. & Feng, Y. Y., 2010 Oct, In : Robotics and Computer-Integrated Manufacturing. 26, 5, p. 507-516 10 p.

Research output: Contribution to journalArticle

4 Citations (Scopus)
2009

Enable SOA-based data exchange architecture with interoperability for heterogeneous systems

Tann, W., Shaw, H-J., Hung, M. H., Wu, S. W. & Cheng, F-T., 2009 Nov 1, In : Journal of Taiwan Society of Naval Architects and Marine Engineers. 28, 4, p. 207-220 14 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

NN-based key-variable selection method for enhancing virtual metrology accuracy

Lin, T. H., Cheng, F. T., Wu, W. M., Kao, C. A., Ye, A. J. & Chang, F. C., 2009 Feb 1, In : IEEE Transactions on Semiconductor Manufacturing. 22, 1, p. 204-211 8 p., 4773490.

Research output: Contribution to journalArticle

34 Citations (Scopus)
2008

Accuracy and real-time considerations for implementing various virtual metrology algorithms

Su, Y. C., Lin, T. H., Cheng, F. T. & Wu, W. M., 2008 Aug 1, In : IEEE Transactions on Semiconductor Manufacturing. 21, 3, p. 426-434 9 p., 4589025.

Research output: Contribution to journalArticle

43 Citations (Scopus)
1 Citation (Scopus)

Development of an Interface C framework for semiconductor e-Diagnostics systems

Hung, M. H., Wang, T. L., Hsu, F. Y. & Cheng, F. T., 2008 Jun 1, In : Robotics and Computer-Integrated Manufacturing. 24, 3, p. 370-383 14 p.

Research output: Contribution to journalArticle

14 Citations (Scopus)

Evaluating reliance level of a virtual metrology system

Cheng, F. T., Chen, Y. T., Su, Y. C. & Zeng, D. L., 2008 Feb 1, In : IEEE Transactions on Semiconductor Manufacturing. 21, 1, p. 92-102 11 p.

Research output: Contribution to journalArticle

55 Citations (Scopus)
2007

A novel virtual metrology scheme for predicting CVD thickness in semiconductor manufacturing

Hung, M. H., Lin, T. H., Cheng, F. T. & Lin, R. C., 2007 Jun 1, In : IEEE/ASME Transactions on Mechatronics. 12, 3, p. 308-316 9 p.

Research output: Contribution to journalArticle

78 Citations (Scopus)

Dual-phase virtual metrology scheme

Cheng, F. T., Huang, H. C. & Kao, C. A., 2007 Nov 1, In : IEEE Transactions on Semiconductor Manufacturing. 20, 4, p. 566-571 6 p., 4369327.

Research output: Contribution to journalArticle

60 Citations (Scopus)
2006

A processing quality prognostics scheme for plasma sputtering in TFT-LCD manufacturing

Su, Y. C., Hung, M. H., Cheng, F. T. & Chen, Y. T., 2006 May 1, In : IEEE Transactions on Semiconductor Manufacturing. 19, 2, p. 183-193 11 p.

Research output: Contribution to journalArticle

49 Citations (Scopus)