Engineering & Materials Science
Annealing
100%
Thin films
55%
Diffusion barriers
48%
Tin oxides
45%
Zinc oxide
35%
Oxide films
34%
Sheet resistance
33%
Thin film transistors
30%
Substrates
29%
Heterojunctions
29%
Metallizing
29%
Thermodynamic stability
26%
Gate dielectrics
22%
Oxygen vacancies
22%
Electrodes
21%
Data storage equipment
20%
Spectrometry
19%
X ray diffraction
18%
Oxides
18%
Temperature
18%
Atoms
18%
Vacuum
17%
Solar cells
17%
Charge trapping
17%
Electrons
17%
Gold nanoparticles
16%
Electric potential
16%
Electric properties
16%
Metals
16%
Plasmas
16%
Reactive sputtering
15%
Surface chemistry
15%
Tungsten
15%
Copolymers
15%
Ohmic contacts
15%
Microstructure
14%
Fluorine
14%
X ray photoelectron spectroscopy
14%
Silicates
14%
Copper
14%
Organic solar cells
13%
Glass
13%
Butyric acid
13%
Sputtering
13%
Transistors
12%
Transmission electron microscopy
12%
Modulation
12%
Capacitors
12%
Chemical Compounds
Annealing
70%
Liquid Film
67%
Diffusion Barrier
38%
Dielectric Material
26%
Sheet Resistance
25%
Voltage
20%
Dioxygen
18%
Capacitor
17%
Thermal Stability
16%
Oxide
16%
Amorphous Material
15%
Behavior as Electrode
14%
Solar Cell
14%
Nitrogen
13%
Electrical Property
13%
Tungsten Oxide
12%
Vacuum
12%
Silicate Glass
12%
Leakage Current
12%
Microstructure
12%
Backscattering
12%
Sputtering
11%
Work Function
10%
Plasma
10%
Band Gap
9%
Nanoparticle
9%
Tin Oxide
9%
Surface Chemistry
9%
Reactive Sputtering
9%
Polycrystalline Solid
9%
X-Ray Diffraction
8%
Copolymer
8%
Surface
8%
Transmittance
7%
Silsesquioxane
7%
Sputter Deposition
7%
Semiconductor
7%
Tungsten
7%
Diffusion
7%
X-Ray Photoelectron Spectroscopy
7%
Scanning Electron Microscopy
7%
Pentacene
6%
Dielectric Constant
6%
Resistance
6%
Transmission Electron Microscopy
6%
Zinc Oxide Nanoparticle
6%
Methyl Ester
6%
Physics & Astronomy
annealing
38%
thin films
34%
transistors
17%
tin oxides
15%
oxygen
15%
thermal stability
14%
zinc oxides
13%
solar cells
13%
oxides
12%
electrical resistivity
12%
electric contacts
11%
electrodes
11%
nitrogen
11%
oxide films
11%
backscattering
9%
nanoparticles
9%
electrical measurement
9%
capacitance
9%
electric potential
9%
microstructure
8%
interlayers
8%
trapping
8%
sputtering
8%
solid phases
7%
capacitors
7%
spectroscopy
7%
ion beams
6%
transmission electron microscopy
6%
gels
6%
electrical properties
6%
performance
6%
x ray spectroscopy
6%
x rays
6%
vacuum
6%
heterojunctions
6%
metals
6%
photoelectron spectroscopy
6%
x ray diffraction
6%
barrier layers
5%
leakage
5%
cathodes
5%
temperature
5%
titanium
5%
tantalum
5%
silicides
5%
illumination
5%
tungsten oxides
5%
diffraction
5%
manufacturing
5%
buffers
5%
