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2019
Enhanced Electrical Performance and Reliability of Ti-IGZO Thin-Film Transistors with HfxAl1-xO Gate Dielectric
Wu, J-H., Zhu, B. C., Wang, S. J., Ko, R-M. & Lin, C. E., 2019 Sept 2, International Conference on Solid State Devices and Materials (SSDM’19). Nagoya University, Aichi, JapanResearch output: Chapter in Book/Report/Conference proceeding › Conference contribution