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  • 國立成功大學電機所博士

Research Interests

  • 發光二極體
  • 固態照明技術
  • 光偵測元件及太陽能電池

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

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Projects 2004 2018

Research Output 1996 2018

GaN intermediate band solar cells with Mn-doped absorption layer

Lee, M. L., Huang, F. W., Chen, P. C. & Sheu, J-K., 2018 Dec 1, In : Scientific Reports. 8, 1, 8641.

Research output: Contribution to journalArticle

solar cells
control equipment
air masses
short circuit currents

Multiple-layered type-II GaSb/GaAs quantum ring solar cells under concentrated solar illumination

Jheng, Y. H., Hsu, S. C., Wu, S. H., Sheu, J-K., Lo, Y. T., Kuo, H. C., Chen, H. A., Lin, S. Y. & Lin, C. C., 2018 May 25, 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017. Institute of Electrical and Electronics Engineers Inc., p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Solar cells
Infrared radiation
1 Citations

Carrier dynamics of Mn-induced states in GaN thin films

Chen, Y. T., Yang, C. Y., Chen, P. C., Sheu, J-K. & Lin, K. H., 2017 Dec 1, In : Scientific Reports. 7, 1, 5788.

Research output: Contribution to journalArticle

thin films
solar cells
optical measurement
light emission

Design of GaN-Based Multicolor Tunnel-Junction Light-Emitting Diodes

Shih, Y. H., Chang, J. Y., Kuo, Y. K., Chen, F. M., Huang, M. F., Lee, M. L. & Sheu, J-K., 2017 Nov 28, (Accepted/In press) In : IEEE Transactions on Electron Devices.

Research output: Contribution to journalArticle

Electron tunneling
Tunnel junctions
Light emitting diodes
1 Citations

Extracting elastic properties of an atomically thin interfacial layer by time-domain analysis of femtosecond acoustics

Chen, H. Y., Huang, Y. R., Shih, H. Y., Chen, M. J., Sheu, J-K. & Sun, C. K., 2017 Nov 20, In : Applied Physics Letters. 111, 21, 213101.

Research output: Contribution to journalArticle

time domain analysis
elastic properties
transmission electron microscopy