Projects per year
Personal profile
Education
- 1998 PhD, Department of Electrical Engineering and Computer Sciences, University of California at Berkeley
Research Interests
- Semiconductor Devices
- Semiconductor Physics
- 元件可靠度
Experience
- 1999~2003 Assistant Professor Department of Electrical Engineering National Cheng Kung University
- 2003~2008 Associate Professor, Department of Electrical Engineering, National Cheng Kung University
- 2008~ present Professor, Department of Electrical Engineering, National Cheng Kung University
- 2011~2014 Director, Institute of Microelectronics, National Cheng Kung University
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Projects
- 21 Finished
Research output
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Investigating the Photodetectors and pH Sensors of Two-Dimensional MoS2with Different Substrates
Chang, S. P., Chen, T. H., Liou, G. Y., Huang, W. L., Lai, W. C., Chang, S. J. & Chen, J. F., 2021, In: ECS Journal of Solid State Science and Technology. 10, 5, 055015.Research output: Contribution to journal › Article › peer-review
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Simulation-Based Study of High-Permittivity Inserted-Oxide FinFET with Low-Permittivity Inner Spacers
Wu, Y. T., Chiang, M. H., Chen, J. F. & Liu, T. J. K., 2021 Nov 1, In: IEEE Transactions on Electron Devices. 68, 11, p. 5529-5534 6 p.Research output: Contribution to journal › Article › peer-review
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Simulation-based study of high-density SRAM voltage scaling enabled by inserted-oxide FinFET technology
Wu, Y. T., Ding, F., Connelly, D., Chiang, M. H., Chen, J. F. & Liu, T. J. K., 2019 Apr, In: IEEE Transactions on Electron Devices. 66, 4, p. 1754-1759 6 p., 8661752.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Characteristics and reliability of metal-oxide-semiconductor transistors with various depths of plasma-induced Si recess structure
Chen, J. F., Tsai, Y. L., Chen, C. Y., Hsu, H. T., Kao, C. Y. & Hwang, H. P., 2018 Apr, In: Japanese Journal of Applied Physics. 57, 4, 04FD01.Research output: Contribution to journal › Article › peer-review
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High-density SRAM voltage scaling enabled by inserted-oxide FinFET technology
Wu, Y. T., Chiang, M. H., Chen, J. F., Ding, F., Connelly, D. & Liu, T. J. K., 2018 Mar 7, 2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017. Institute of Electrical and Electronics Engineers Inc., p. 1-3 3 p. (2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017; vol. 2018-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2 Citations (Scopus)