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Personal profile

Education

  • 1998 PhD, Department of Electrical Engineering and Computer Sciences, University of California at Berkeley

Research Interests

  • Semiconductor Devices
  • Semiconductor Physics
  • 元件可靠度

Experience

  • 1999~2003 Assistant Professor Department of Electrical Engineering National Cheng Kung University
  • 2003~2008 Associate Professor, Department of Electrical Engineering, National Cheng Kung University
  • 2008~ present Professor, Department of Electrical Engineering, National Cheng Kung University
  • 2011~2014 Director, Institute of Microelectronics, National Cheng Kung University

Fingerprint Dive into the research topics where Jone-Fang Chen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 12 Similar Profiles
Hot carriers Engineering & Materials Science
Transistors Engineering & Materials Science
Degradation Engineering & Materials Science
metal oxide semiconductors Physics & Astronomy
Light emitting diodes Engineering & Materials Science
Electric potential Engineering & Materials Science
Metals Engineering & Materials Science
MOSFET devices Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Projects 1999 2018

Research Output 1995 2019

  • 2282 Citations
  • 25 h-Index
  • 99 Article
  • 14 Conference contribution
  • 2 Conference article
  • 1 Letter

Simulation-based study of high-density SRAM voltage scaling enabled by inserted-oxide FinFET technology

Wu, Y. T., Ding, F., Connelly, D., Chiang, M-H., Chen, J-F. & Liu, T. J. K., 2019 Apr 1, In : IEEE Transactions on Electron Devices. 66, 4, p. 1754-1759 6 p., 8661752.

Research output: Contribution to journalArticle

Static random access storage
Oxides
Nanowires
Transistors
Electric potential

Characteristics and reliability of metal-oxide-semiconductor transistors with various depths of plasma-induced Si recess structure

Chen, J-F., Tsai, Y. L., Chen, C. Y., Hsu, H. T., Kao, C. Y. & Hwang, H. P., 2018 Apr 1, In : Japanese Journal of Applied Physics. 57, 4, 04FD01.

Research output: Contribution to journalArticle

recesses
Hot carriers
metal oxide semiconductors
Transistors
transistors
2 Citations (Scopus)

High-density SRAM voltage scaling enabled by inserted-oxide FinFET technology

Wu, Y. T., Chiang, M-H., Chen, J-F., Ding, F., Connelly, D. & Liu, T. J. K., 2018 Mar 7, 2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017. Institute of Electrical and Electronics Engineers Inc., p. 1-3 3 p. (2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017; vol. 2018-March).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Static random access storage
Oxides
Electric potential
Threshold voltage
Ion implantation

Investigation of characteristics and hot-carrier reliability of high-voltage MOS transistors with various doping concentrations in the drift region

Tsai, Y. L., Chen, J-F., Shen, S. F., Hsu, H. T., Kao, C. Y., Chang, K. F. & Hwang, H. P., 2018 Nov 13, In : Semiconductor Science and Technology. 33, 12, 125019.

Research output: Contribution to journalArticle

Hot carriers
MOSFET devices
high voltages
transistors
Doping (additives)
9 Citations (Scopus)

Simulation-Based Study of Hybrid Fin/Planar LDMOS Design for FinFET-Based System-on-Chip Technology

Wu, Y. T., Ding, F., Connelly, D., Zheng, P., Chiang, M-H., Chen, J-F. & Liu, T. J. K., 2017 Oct 1, In : IEEE Transactions on Electron Devices. 64, 10, p. 4193-4199 7 p., 8010312.

Research output: Contribution to journalArticle

Field effect transistors
Electric breakdown
Computer aided design
Semiconductor materials
Electric potential

Thesis

Analysis on Hot Carrier Reliability for High Voltage MOS Device with Different Processes

Author: 俊諺, 陳., 2017 Jul 3

Supervisor: Chen, J. (Supervisor)

Student thesis: Master's Thesis

Analysis on Reliability for FinFET with Different Processes

Author: 佑軒, 李., 2018 Jul 5

Supervisor: Chen, J. (Supervisor)

Student thesis: Master's Thesis

Bifacial Sensing Sides SnO2 MEMS Gas Sensor

Author: 梃嘉, 翁., 2017 Jul 5

Supervisor: Chen, J. (Supervisor)

Student thesis: Master's Thesis

Breakdown Voltage and Reliability Studies of Devices in NAND Flash Memory Periphery Circuitry

Author: 鈞博, 張., 2014 Jul 16

Supervisor: Chen, J. (Supervisor)

Student thesis: Master's Thesis

Effect of Gradual Junction on Performance and Reliability of High Voltage MOS Transistors

Author: 登仁, 艾., 2015 Jul 1

Supervisor: Chen, J. (Supervisor)

Student thesis: Master's Thesis