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Personal profile

Education

  • 1998 PhD, Department of Electrical Engineering and Computer Sciences, University of California at Berkeley

Research Interests

  • Semiconductor Devices
  • Semiconductor Physics
  • 元件可靠度

Experience

  • 1999~2003 Assistant Professor Department of Electrical Engineering National Cheng Kung University
  • 2003~2008 Associate Professor, Department of Electrical Engineering, National Cheng Kung University
  • 2008~ present Professor, Department of Electrical Engineering, National Cheng Kung University
  • 2011~2014 Director, Institute of Microelectronics, National Cheng Kung University

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Projects

Research Output

Simulation-based study of high-density SRAM voltage scaling enabled by inserted-oxide FinFET technology

Wu, Y. T., Ding, F., Connelly, D., Chiang, M. H., Chen, J. F. & Liu, T. J. K., 2019 Apr, In : IEEE Transactions on Electron Devices. 66, 4, p. 1754-1759 6 p., 8661752.

Research output: Contribution to journalArticle

  • Characteristics and reliability of metal-oxide-semiconductor transistors with various depths of plasma-induced Si recess structure

    Chen, J-F., Tsai, Y. L., Chen, C. Y., Hsu, H. T., Kao, C. Y. & Hwang, H. P., 2018 Apr 1, In : Japanese Journal of Applied Physics. 57, 4, 04FD01.

    Research output: Contribution to journalArticle

  • High-density SRAM voltage scaling enabled by inserted-oxide FinFET technology

    Wu, Y. T., Chiang, M. H., Chen, J. F., Ding, F., Connelly, D. & Liu, T. J. K., 2018 Mar 7, 2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017. Institute of Electrical and Electronics Engineers Inc., p. 1-3 3 p. (2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017; vol. 2018-March).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2 Citations (Scopus)

    Investigation of characteristics and hot-carrier reliability of high-voltage MOS transistors with various doping concentrations in the drift region

    Tsai, Y. L., Chen, J. F., Shen, S. F., Hsu, H. T., Kao, C. Y., Chang, K. F. & Hwang, H. P., 2018 Nov 13, In : Semiconductor Science and Technology. 33, 12, 125019.

    Research output: Contribution to journalArticle

  • Simulation-Based Study of Hybrid Fin/Planar LDMOS Design for FinFET-Based System-on-Chip Technology

    Wu, Y. T., Ding, F., Connelly, D., Zheng, P., Chiang, M. H., Chen, J. F. & Liu, T. J. K., 2017 Oct, In : IEEE Transactions on Electron Devices. 64, 10, p. 4193-4199 7 p., 8010312.

    Research output: Contribution to journalArticle

  • 11 Citations (Scopus)

    Thesis

    Analysis on Hot Carrier Reliability for High Voltage MOS Device with Different Processes

    Author: 俊諺, 陳., 2017 Jul 3

    Supervisor: Chen, J. (Supervisor)

    Student thesis: Master's Thesis

    Analysis on Reliability for FinFET with Different Processes

    Author: 佑軒, 李., 2018 Jul 5

    Supervisor: Chen, J. (Supervisor)

    Student thesis: Master's Thesis

    Bifacial Sensing Sides SnO2 MEMS Gas Sensor

    Author: 梃嘉, 翁., 2017 Jul 5

    Supervisor: Chen, J. (Supervisor)

    Student thesis: Master's Thesis

    Breakdown Voltage and Reliability Studies of Devices in NAND Flash Memory Periphery Circuitry

    Author: 鈞博, 張., 2014 Jul 16

    Supervisor: Chen, J. (Supervisor)

    Student thesis: Master's Thesis

    Effect of Gradual Junction on Performance and Reliability of High Voltage MOS Transistors

    Author: 登仁, 艾., 2015 Jul 1

    Supervisor: Chen, J. (Supervisor)

    Student thesis: Master's Thesis