Engineering & Materials Science
Annealing
18%
Capacitors
7%
Carrier lifetime
10%
Computer aided design
13%
Dark currents
10%
Defects
6%
Degradation
45%
Doping (additives)
13%
Electric breakdown
9%
Electric fields
7%
Electric potential
31%
Electromigration
14%
Electron injection
9%
Electrons
13%
Epitaxial films
8%
Field effect transistors
9%
FinFET
17%
Gate dielectrics
12%
Hot carriers
100%
Hot electrons
7%
Interface states
21%
Leakage currents
17%
Light emitting diodes
36%
Metallizing
6%
Metals
37%
MOS devices
7%
MOSFET devices
31%
Nanowires
8%
Nitridation
7%
Nitrides
13%
Oxide semiconductors
36%
Oxides
33%
Photodetectors
18%
Photoluminescence
9%
Plasma density
7%
Plasmas
7%
Semiconductor materials
16%
Semiconductor quantum wells
7%
Static random access storage
8%
Substrates
14%
Surface cleaning
7%
Telegraph
14%
Threshold voltage
7%
Tin oxides
17%
Transconductance
6%
Transistors
45%
Vapor deposition
7%
Zinc Selenide
7%
Physics & Astronomy
annealing
9%
capacitors
5%
carrier lifetime
5%
characterization
5%
CMOS
7%
computer aided design
6%
dark current
6%
degradation
23%
electric potential
9%
electrodes
6%
field effect transistors
16%
high voltages
14%
implantation
5%
indium oxides
11%
injection
6%
isolation
8%
leakage
9%
light emitting diodes
16%
metal oxide semiconductors
41%
metals
10%
nitrides
5%
oxides
8%
photometers
11%
tin oxides
12%
transistors
27%
traps
6%
Chemical Compounds
Annealing
9%
Avalanche Breakdown
6%
Breakdown Voltage
6%
Capacitor
5%
Charge Pumping
10%
Dielectric Material
9%
Drain Current
8%
Electric Field
5%
Electrical Property
5%
Electron Particle
5%
Epitaxial Film
10%
Field Effect
8%
Hot Electron
8%
Impact Ionization
6%
Interface State
19%
Leakage Current
21%
Liquid Film
5%
Mechanical Stress
6%
Molecular Beam Epitaxy
5%
Nanowire
5%
Oxide
9%
Parasitic
6%
Photoluminescence
5%
Purity
5%
Reduction
6%
Semiconductor
6%
Simulation
10%
Transconductance
8%
Trap Density Measurement
5%
Tunneling
9%
Voltage
23%
