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Research Output

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Conference contribution
2018

High-density SRAM voltage scaling enabled by inserted-oxide FinFET technology

Wu, Y. T., Chiang, M. H., Chen, J. F., Ding, F., Connelly, D. & Liu, T. J. K., 2018 Mar 7, 2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017. Institute of Electrical and Electronics Engineers Inc., p. 1-3 3 p. (2017 IEEE SOI-3D-Subthreshold Microelectronics Unified Conference, S3S 2017; vol. 2018-March).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
2010

The influence of the layout on the ESD performance Of HV-LDMOS

Lee, J. H., Su, H. D., Chan, C. L., Yang, D. H., Chen, J. F. & Wu, K. M., 2010 Sep 20, 2010 22nd International Symposium on Power Semiconductor Devices and IC's, ISPSD 2010. p. 303-306 4 p. 5543900. (Proceedings of the International Symposium on Power Semiconductor Devices and ICs).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

32 Citations (Scopus)
2009

Effect of NDD dosage on hot-carrier reliability in DMOS transistors

Chen, J-F., Tian, K. S., Chen, S. Y., Wu, K. M. & Liu, C. M., 2009 Jul 8, Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009. p. 226-229 4 p. 4810298. (Proceedings of the 10th International Symposium on Quality Electronic Design, ISQED 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

The study of sensitive circuit and layout for CDM improvement

Lee, J. H., Shih, J. R., Guo, S., Yang, D. H., Chen, J. F., Su, D. & Wu, K., 2009 Nov 16, Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009. p. 228-232 5 p. 5232664. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Citations (Scopus)
2008

A novel ESD device structure with fully silicide process for mixed high/low voltage operation

Lee, J. H., Shih, J. R., Yang, D. H., Chen, J. F. & Wu, K., 2008 Sep 23, 2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. 4588153. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Impact of hot-hole injection on the characteristics of high-voltage mos transistors

Chen, J. F., Lee, J. R., Wu, K. M. & Liu, C. M., 2008 Dec 1, ISE 13 - 13th International Symposium on Electrets, Proceedings. p. C114 4814056. (Proceedings - International Symposium on Electrets).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2007

Effects of drift-region design on the reliability of integrated high-voltage LDMOS transistors

Chen, J. F., Chen, S. Y., Tian, K. S., Wu, K. M., Su, Y. K., Liu, C. M. & Hsu, S. L., 2007 Dec 1, Proceedings 2007 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT. p. 121-124 4 p. 4299554. (Proceedings 2007 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Influence of surface cleaning on stressvoiding and electromigration of Cu damascene interconnection

Wang, J. P., Su, Y. K. & Chen, J. F., 2007 Sep 25, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 646-647 2 p. 4227734. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)
2006

Single DC/AC CCFL inverter for large size LCD TV with burst control

Chen, S. M., Liang, T. J. & Chen, J. F., 2006 Dec 1, APCCAS 2006 - 2006 IEEE Asia Pacific Conference on Circuits and Systems. p. 844-847 4 p. 4145525. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)
2005

Hot-carrier reliability in submicrometer 40V LDMOS transistors with thick gate oxide

Chen, J. F., Wu, K. M., Lin, K. W., Su, Y. K. & Hsu, S. L., 2005 Dec 15, 2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual. p. 560-564 5 p. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

40 Citations (Scopus)
2003

400nm InGaN/GaN and InGaN/AlGaN multiquantum well light-emitting diodes

Chang, S. J., Kuo, C. H., Su, Y. K., Wu, L. W., Sheu, J. K., Wen, T. C., Lai, W. C., Chen, J. F. & Tsai, J. M., 2003 Jan 1, Proceedings of the 6th Chinese Optoelectronics Symposium, COES 2003. Chan, K. T. & Kwok, H. S. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 91-94 4 p. 1278172. (Proceedings of the 6th Chinese Optoelectronics Symposium, COES 2003).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2002

A new observation in hot-carrier induced drain current degradation in deep-sub-micrometer nMOSFETs

Chen, J. F. & Tsao, C. P., 2002 Jan 1, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2002. Chim, W. K., Thong, J., Tan, W. & Lee, K. C. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 31-34 4 p. 1025607. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA; vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1998

Channel width dependence of hot-carrier induced degradation in shallow trench isolated pMOSFETs

Ishimaru, K., Chen, J. F. & Hu, C., 1998 Jan 1, ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference. Touboul, A., Danto, Y. & Grunbacher, H. (eds.). IEEE Computer Society, p. 240-243 4 p. 1503533. (European Solid-State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution