• 1316 Citations
  • 19 h-Index
1990 …2020
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Research Output 1990 2019

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Chapter
2006
2 Citations (Scopus)

Boundary scan and core-based testing

Lee, K-J., 2006 Dec 1, VLSI Test Principles and Architectures. Elsevier Inc., p. 557-618 62 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Testing
Industry
Controller
1 Citation (Scopus)

Test compression

Li, X., Lee, K-J. & Touba, N. A., 2006 Dec 1, VLSI Test Principles and Architectures. Elsevier Inc., p. 341-396 56 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Compression
Broadcasting
Industry
Bandwidth
Testing