昆忠 李

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Kuen-Jong Lee

Professor

Calculated based on number of publications stored in Pure and citations from Scopus
1990 …2023

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  • 2006

    Boundary Scan and Core-Based Testing

    Lee, K. J., 2006 Jan 1, VLSI Test Principles and Architectures: Design for Testability. Elsevier, p. 557-618 62 p.

    Research output: Chapter in Book/Report/Conference proceeding › Chapter

    2 Citations (Scopus)

  • Test Compression

    Li, X., Lee, K. J. & Touba, N. A., 2006 Jan 1, VLSI Test Principles and Architectures: Design for Testability. Elsevier, p. 341-396 56 p.

    Research output: Chapter in Book/Report/Conference proceeding › Chapter

    3 Citations (Scopus)