Projects per year
Personal profile
Education
- 2013 PhD, Electrical Engineering, KULeuven, Belgium
Research Interests
- Semiconductor Physics and Devices
Experience
- 2009~2013 PhD researcher, Inter-university Microelectronic Centre (imec), Belgium
- 2014~present Assistant Professor, Department of Electrical Engineering, National Cheng Kung University, Taiwan
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Projects
- 9 Finished
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量子電子元件與人工智慧於半導體產業之應用 : 機器學習導向之量子傳輸模擬 及 與現今半導體製程相容之新穎元件製作( V )
Kao, K.-H. (PI)
22-02-01 → 23-01-31
Project: Research project
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量子電子元件與人工智慧於半導體產業之應用 : 機器學習導向之量子傳輸模擬 及 與現今半導體製程相容之新穎元件製作( IV )
Kao, K.-H. (PI)
21-02-01 → 22-01-31
Project: Research project
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量子電子元件與人工智慧於半導體產業之應用 : 機器學習導向之量子傳輸模擬及與現今半導體製程相容之新穎元件製作(3/5)
Kao, K.-H. (PI)
20-02-01 → 21-01-31
Project: Research project
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量子電子元件與人工智慧於半導體產業之應用 : 機器學習導向之量子傳輸模擬 及 與現今半導體製程相容之新穎元件製作(2/5)
Kao, K.-H. (PI)
19-02-01 → 20-01-31
Project: Research project
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量子電子元件與人工智慧於半導體產業之應用 : 機器學習導向之量子傳輸模擬 及 與現今半導體製程相容之新穎元件製作(2/5)
Kao, K.-H. (PI)
19-02-01 → 20-01-31
Project: Research project
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High-Performance Junctionless Ferroelectric Thin-Film Transistor for Low-Voltage and High-Speed Nonvolatile Memory Applications
Ma, W. C. Y., Su, C. J., Kao, K. H., Yen, Y. C., Yang, J. M., Li, Y. H., Chen, Y. C., Lin, J. Y. & Chang, H. W., 2025, In: IEEE Transactions on Electron Devices. 72, 1, p. 247-252 6 p.Research output: Contribution to journal › Article › peer-review
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Impact of Pulse Voltage Stress on the Reliability of Ferroelectric Thin-Film Transistor
Ma, W. C. Y., Su, C. J., Kao, K. H., Yen, Y. C., Yang, J. M., Li, Y. H., Chen, Y. C., Lin, J. Y. & Chang, H. W., 2025, (Accepted/In press) In: IEEE Transactions on Device and Materials Reliability.Research output: Contribution to journal › Article › peer-review
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Statistical analysis of spurious dot formation in silicon metal-oxide-semiconductor single electron transistors
Chen, K. C., Godfrin, C., Simion, G., Fattal, I., Jussot, J., Kubicek, S., Beyne, S., Raes, B., Loenders, A., Kao, K. H., Wan, D. & De Greve, K., 2025 Mar 15, In: Physical Review B. 111, 12, 125301.Research output: Contribution to journal › Article › peer-review
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Yttrium Doped Hf0.5Zr0.5O2 Based Ferroelectric Capacitor Exhibiting Fatigue Free (>1012 cycles), Long Retention, and Imprint Immune Performance at 4 K
Agarwal, A., Walke, A. M., Ronchi, N., Popovici, M. I., Ma, W. C. Y., Su, C. J., Kao, K. H. & Houdt, J. V., 2025, (Accepted/In press) In: IEEE Electron Device Letters.Research output: Contribution to journal › Article › peer-review
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ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology
Chen, S. H., Fu, P. Y., Tsiara, A., Van De Peer, M., Simicic, M., Musibau, S., Ban, Y., Kao, K. H., Chen, W. C., Serbulova, K., Van Campenhout, J., Absil, P. & Croes, K., 2024, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2024, EOS/ESD 2024. ESD Association, (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution