Projects per year
Personal profile
Education
- 2001 PhD, Electrical and Computer Engineering, University of Florida
Research Interests
- Modeling and Simulation
- Semiconductor Device Physics
Experience
- 2001~2003 Senior Device Engineer, AMD
- 2003/02 ~ 2014/01 Faculty Member, Department of Electronic Engineering, National Ilan University
- 2014/02 ~ 2015/7 Associate Professor, Department of Electrical Engineering, National Cheng Kung University
- 2015/08 ~ present Professor, Department of Electrical Engineering, National Cheng Kung University
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Projects
- 5 Finished
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Extracting Device Parameters of TFTs With Ultrathin Channels at Low Temperatures by Particle Swarm Optimization
Chen, Y. C., Chou, J. P., Chen, K. C., Lin, J. Y., Ma, W. C. Y., Kao, K. H., Chiang, M. H. & Wang, Y. H., 2024, In: IEEE Transactions on Electron Devices. 71, 8, p. 4717-4722 6 p.Research output: Contribution to journal › Article › peer-review
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Fabrication of Hybrid Fin/Planar LDMOS with Modulation Gate
Chen, Z. F., Huang, Y. C., Lai, Y. S., Wu, Y. T., Huang, C. M. & Chiang, M. H., 2024, DRC 2024 - 82nd Device Research Conference. Institute of Electrical and Electronics Engineers Inc., (Device Research Conference - Conference Digest, DRC).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Simulation Study of the Subthreshold Characteristics of Cryogenic UTBB FDSOI with Interface Traps and Back-Gate Operation
Chang, M. Y., Chang, W. C., Wang, Y. H. & Chiang, M. H., 2024, 2024 IEEE Nanotechnology Materials and Devices Conference, NMDC 2024. Institute of Electrical and Electronics Engineers Inc., p. 41-44 4 p. (2024 IEEE Nanotechnology Materials and Devices Conference, NMDC 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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First Demonstration of Defect Elimination for Cryogenic Ge FinFET CMOS Inverter Showing Steep Subthreshold Slope by Using Ge-on-Insulator Structure
Yu, X. R., Hsieh, C. C., Chuang, M. H., Chiu, M. Y., Sun, T. C., Geng, W. Z., Chang, W. H., Shih, Y. J., Lu, W. H., Chang, W. C., Lin, Y. C., Pai, Y. C., Lai, C. Y., Chuang, M. H., Dei, Y., Yang, C. Y., Lu, H. Y., Lin, N. C., Wu, C. T. & Kao, K. H. & 9 others, , 2023, 2023 International Electron Devices Meeting, IEDM 2023. Institute of Electrical and Electronics Engineers Inc., (Technical Digest - International Electron Devices Meeting, IEDM).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1 Citation (Scopus) -
How Fault-Tolerant Quantum Computing Benefits from Cryo-CMOS Technology
Chiang, H. L., Hadi, R. A., Wang, J. F., Han, H. C., Wu, J. J., Hsieh, H. H., Horng, J. J., Chou, W. S., Lien, B. S., Chang, C. H., Chen, Y. C., Wang, Y. H., Chen, T. C., Liu, J. C., Liu, Y. C., Chiang, M. H., Kao, K. H., Pulicherla, B., Cai, J. & Chang, C. S. & 9 others, , 2023, 2023 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2023. Institute of Electrical and Electronics Engineers Inc., (Digest of Technical Papers - Symposium on VLSI Technology; vol. 2023-June).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
9 Citations (Scopus)