Projects per year
Personal profile
Education
- 2001 PhD, Electrical and Computer Engineering, University of Florida
Research Interests
- Modeling and Simulation
- Semiconductor Device Physics
Experience
- 2001~2003 Senior Device Engineer, AMD
- 2003/02 ~ 2014/01 Faculty Member, Department of Electronic Engineering, National Ilan University
- 2014/02 ~ 2015/7 Associate Professor, Department of Electrical Engineering, National Cheng Kung University
- 2015/08 ~ present Professor, Department of Electrical Engineering, National Cheng Kung University
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Collaborations and top research areas from the last five years
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Projects
- 5 Finished
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Cross Field-Effect Transistor With Adjustable Threshold Voltage and High Ring-Oscillator Frequency
Chang, M. Y., Wu, Y. T., Ding, F. & Chiang, M. H., 2025, In: IEEE Transactions on Electron Devices. 72, 6, p. 2848-2854 7 p.Research output: Contribution to journal › Article › peer-review
2 Citations (Scopus) -
Extracting Device Parameters of TFTs With Ultrathin Channels at Low Temperatures by Particle Swarm Optimization
Chen, Y. C., Chou, J. P., Chen, K. C., Lin, J. Y., Ma, W. C. Y., Kao, K. H., Chiang, M. H. & Wang, Y. H., 2024, In: IEEE Transactions on Electron Devices. 71, 8, p. 4717-4722 6 p.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Fabrication of Hybrid Fin/Planar LDMOS with Modulation Gate
Chen, Z. F., Huang, Y. C., Lai, Y. S., Wu, Y. T., Huang, C. M. & Chiang, M. H., 2024, DRC 2024 - 82nd Device Research Conference. Institute of Electrical and Electronics Engineers Inc., (Device Research Conference - Conference Digest, DRC).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Simulation Study of the Subthreshold Characteristics of Cryogenic UTBB FDSOI with Interface Traps and Back-Gate Operation
Chang, M. Y., Chang, W. C., Wang, Y. H. & Chiang, M. H., 2024, 2024 IEEE Nanotechnology Materials and Devices Conference, NMDC 2024. Institute of Electrical and Electronics Engineers Inc., p. 41-44 4 p. (2024 IEEE Nanotechnology Materials and Devices Conference, NMDC 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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First Demonstration of Defect Elimination for Cryogenic Ge FinFET CMOS Inverter Showing Steep Subthreshold Slope by Using Ge-on-Insulator Structure
Yu, X. R., Hsieh, C. C., Chuang, M. H., Chiu, M. Y., Sun, T. C., Geng, W. Z., Chang, W. H., Shih, Y. J., Lu, W. H., Chang, W. C., Lin, Y. C., Pai, Y. C., Lai, C. Y., Chuang, M. H., Dei, Y., Yang, C. Y., Lu, H. Y., Lin, N. C., Wu, C. T. & Kao, K. H. & 9 others, , 2023, 2023 International Electron Devices Meeting, IEDM 2023. Institute of Electrical and Electronics Engineers Inc., (Technical Digest - International Electron Devices Meeting, IEDM).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1 Citation (Scopus)