Research output per year
Research output per year
Personal profile
Education
- Georgia Institute of Technology 博士
Research Interests
- 半導體可靠度與良率管理
- 機器學習與資料分析
- 半導體製程
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Dive into the research topics where Shu-Han Hsu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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Long-term surgical outcomes of hemiarthroplasty for patients with femoral neck fracture with metal versus ceramic head in Taiwan
Huang, C. C., Fu, S. H., Liao, Y. H., Wang, J. D., Hsu, S. H., Chang, C. W. & Ku, L. J. E., 2024, (Accepted/In press) In: Journal of the Formosan Medical Association.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Extraction of wearout model parameters using on-line test of an SRAM
Hsu, S. H., Huang, Y. Y., Wu, Y. D., Yang, K., Lin, L. H. & Milor, L., 2020 Nov, In: Microelectronics Reliability. 114, 113756.Research output: Contribution to journal › Article › peer-review
Open Access1 Citation (Scopus) -
Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation
Wu, Y. D., Yang, K., Hsu, S. H. & Milor, L., 2020 Dec, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28, 12, p. 2658-2671 14 p., 9184236.Research output: Contribution to journal › Article › peer-review
2 Citations (Scopus) -
Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators
Hsu, S. H., Huang, Y. Y., Wu, Y. D., Yang, K., Lin, L. H. & Milor, L., 2020 Nov, In: Microelectronics Reliability. 114, 113753.Research output: Contribution to journal › Article › peer-review
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Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure
Hsu, S. H., Huang, Y. Y., Yang, K. & Milor, L., 2019 Jul, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 257-262 6 p. 8854409. (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2 Citations (Scopus)