Research output per year
Research output per year
Personal profile
Education
- Georgia Institute of Technology 博士
Research Interests
- 半導體可靠度與良率管理
- 機器學習與資料分析
- 半導體製程
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Dive into the research topics where Shu-Han Hsu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Extraction of wearout model parameters using on-line test of an SRAM
Hsu, S. H., Huang, Y. Y., Wu, Y. D., Yang, K., Lin, L. H. & Milor, L., 2020 Nov, In: Microelectronics Reliability. 114, 113756.Research output: Contribution to journal › Article › peer-review
Open Access -
Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation
Wu, Y. D., Yang, K., Hsu, S. H. & Milor, L., 2020 Dec, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28, 12, p. 2658-2671 14 p., 9184236.Research output: Contribution to journal › Article › peer-review
1 Citation (Scopus) -
Optimal sampling for accelerated testing in 14 nm FinFET ring oscillators
Hsu, S. H., Huang, Y. Y., Wu, Y. D., Yang, K., Lin, L. H. & Milor, L., 2020 Nov, In: Microelectronics Reliability. 114, 113753.Research output: Contribution to journal › Article › peer-review
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Identification of Failure Modes for Circuit Samples with Confounded Causes of Failure
Hsu, S. H., Huang, Y. Y., Yang, K. & Milor, L., 2019 Jul, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 257-262 6 p. 8854409. (2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Machine Learning for Detection of Competing Wearout Mechanisms
Hsu, S. H., Yang, K. & Milor, L., 2019 May 22, 2019 IEEE International Reliability Physics Symposium, IRPS 2019. Institute of Electrical and Electronics Engineers Inc., 8720533. (IEEE International Reliability Physics Symposium Proceedings; vol. 2019-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
3 Citations (Scopus)