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可靠度測試下金氧半電晶體特性退化之縮放比例因子研究(I)
陳, 志方
(PI)
Master Degree Program on Nano-Integrated-Circuit Engineering
Institute of Microelectronics
Project
:
Research project
Overview
Project Details
Status
Finished
Effective start/end date
19-08-01
→
20-07-31
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