微電子廠房結構震動特性之分西試驗與減振評估

Translated title of the contribution: 微電子廠房結構震動特性之分西試驗與減振評估

George C. Yao, 林義祥

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Translated title of the contribution微電子廠房結構震動特性之分西試驗與減振評估
Original languageChinese
Title of host publication第二十屆中日工程技術研討會公共工程組
Place of Publication台南市成功大學
Publication statusPublished - 1999

All Science Journal Classification (ASJC) codes

  • Architecture

Cite this