Abstract
一種磁性穿遂接面結構之絕緣層檢測法,所述磁性穿遂接面結構具有依序上下疊接之一上鐵磁層、一絕緣層及一下鐵磁層,磁性穿遂接面結構之絕緣層檢測法包含以下步驟:(A)量測上、下鐵磁層間於不同頻率下之電容。(B)由步驟(A)所量測之電容變化情形,判測絕緣層之品質優劣。
Original language | Chinese (Traditional) |
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Patent number | I259281 |
Publication status | Published - 1800 |
Original language | Chinese (Traditional) |
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Patent number | I259281 |
Publication status | Published - 1800 |