Abstract
Design of a new low-voltage similarity measurement circuit is proposed in this paper. The similarity measurement between two binary patterns is represented by Hamming metric, that is, average absolute differential function. Using clock bootstrapped and level shift techniques, the supply voltage of the circuit is reduced to 1 V, which can efficiently operate within a battery supply. Some simple elements such as capacitor array, switch, and exclusive NOR gates are adopted to achieve Hamming metric function. An experimental chip is implemented by using a 0.25 μm CMOS technology. The simulation results show the circuit responds a 21-mV difference for each one-pixel difference between two binary patterns. The patterns have dimension 6×4 pixels.
Original language | English |
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Pages | 36-39 |
Number of pages | 4 |
Publication status | Published - 2005 Oct 31 |
Event | 9th IEEE International Workshop on Cellular Neural Networks and their Applications, CNNA - Hsinchu, Taiwan Duration: 2005 May 28 → 2005 May 30 |
Other
Other | 9th IEEE International Workshop on Cellular Neural Networks and their Applications, CNNA |
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Country/Territory | Taiwan |
City | Hsinchu |
Period | 05-05-28 → 05-05-30 |
All Science Journal Classification (ASJC) codes
- Software