Abstract
Switching buck converters with dynamic voltage scaling (DVS) for high-efficiency high-performance computing applications need to reduce the output-voltage undershoot/overshoot (V-{ {US}}/V-{ {OS}}) and settling time t-{ {S}} under a large and fast-changing load current (I-{ {load}}). A multiphase topology with a fast load-transient response meets these requirements. The load-transient response can be accurately accelerated to reduce V-{ {US}}/V-{ {OS}} and t-{ {S}} to near their ideal values by measuring the output-capacitor current I-{ {C} {o}} to control the inductor's energizing and de-energizing times, since I-{ {C} {o}} instantly reflects the load-current transients. An integrated capacitor-current sensor (CCS) [1] can be used to sense I-{ {C} {o}} by emulating the output-capacitor impedance Z-{ {C} {o}}: comprising capacitance C-{{O}}, the equivalent series resistance R-{ {E} {S} {R}}, and inductance L-{ {E} {S} {L}}. However, I-{ {C} {o}} will be inaccurately sensed if Z-{ {C} {o}} varies with different output voltages V-{{O}}, manufacturing variations, PCB parasitics, temperature, and aging. The state-of-the-art CCS calibration technique [1] for such Z-{ {C} {o}} variations is suitable for foreground operation and DVS with pre-characterized V-{{O}} levels, since calibration starts immediately after being enabled and runs continuously until it ends. The CCS in [1] is calibrated with a low-power cost-effective comparator and successive approximation logic, with an acceptable calibration time T-{{CAL}} for foreground operation. To broaden the range of applications, this work proposes an ADC-based CCS and a background CCS calibration (BCC) controller. The proposed CCS uses a flash ADC with a dynamic reference to shorten T-{ {C} {A} {L}}. The BCC controller automatically finds a quasi-steady state (OS), namely a short period of steady-state behavior when there is no load transient or DVS event, to trigger CCS calibration, and can interrupt CCS calibration when a load transient or a DVS event occurs. Since OSs generally exist, the BCC with a short T-{{CAL}} can increase the flexibility of scheduling both load transients and DVS events. Thus, it is suitable for DVS with numerous V-{{O}} levels that account for in situ parameter variations.
| Original language | English |
|---|---|
| Title of host publication | 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 430-432 |
| Number of pages | 3 |
| ISBN (Electronic) | 9781538685310 |
| DOIs | |
| Publication status | Published - 2019 Mar 6 |
| Event | 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 - San Francisco, United States Duration: 2019 Feb 17 → 2019 Feb 21 |
Publication series
| Name | Digest of Technical Papers - IEEE International Solid-State Circuits Conference |
|---|---|
| Volume | 2019-February |
| ISSN (Print) | 0193-6530 |
Conference
| Conference | 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 |
|---|---|
| Country/Territory | United States |
| City | San Francisco |
| Period | 19-02-17 → 19-02-21 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
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