Abstract
An innovative method using side illuminations with digital CCDs to detect the specific protrusions for color filters of TFTLCD is developed in this study. The experimental results show that the detection of the protrusion with the height of 280 μm at ±7% uncertainty can be achieved within 3 seconds for the 1850 mm*1500 mm panel. In other words, the method is very effective to prevent the high-value photo-mask from damage.
| Original language | English |
|---|---|
| Title of host publication | 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 |
| Pages | 1077-1079 |
| Number of pages | 3 |
| Publication status | Published - 2010 Dec 1 |
| Event | 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 - Seattle, WA, United States Duration: 2010 May 23 → 2010 May 28 |
Publication series
| Name | 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 |
|---|---|
| Volume | 2 |
Other
| Other | 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 |
|---|---|
| Country | United States |
| City | Seattle, WA |
| Period | 10-05-23 → 10-05-28 |
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Information Systems
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Cite this
Tzu, F. M., & Chou, J-H. (2010). 72.3: Protrusive interception for TFT-LCDs using side-view illumination method. In 48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010 (pp. 1077-1079). (48th Annual SID Symposium, Seminar, and Exhibition 2010, Display Week 2010; Vol. 2).