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  • 2020
  • 2019
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Author

  • Cheng-Wen Wu
Article

A Built-Off Self-Repair Scheme for Channel-Based 3D Memories

Liu, H. H., Lin, B. Y., Wu, C. W., Chiang, W. T., Mincent, L., Lin, H. C., Peng, C. N. & Wang, M. J., 2017 Aug 1, In : IEEE Transactions on Computers. 66, 8, p. 1293-1301 9 p., 7850958.

Research output: Contribution to journalArticle

2 Citations (Scopus)

A local parallel search approach for memory failure pattern identification

Lin, B. Y., Wu, C. W., Lee, M., Lin, H. C., Peng, C. N. & Wang, M. J., 2016 Mar 1, In : IEEE Transactions on Computers. 65, 3, p. 770-780 11 p., 7173026.

Research output: Contribution to journalArticle

3 Citations (Scopus)

Building a fault tolerant framework with deadline guarantee in big data stream computing environments

Sun, D., Zhang, G., Wu, C., Li, K. & Zheng, W., 2017 Nov, In : Journal of Computer and System Sciences. 89, p. 4-23 20 p.

Research output: Contribution to journalArticle

12 Citations (Scopus)

Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement

Lin, B. Y., Chiang, W. T., Wu, C. W., Lee, M., Lin, H. C., Peng, C. N. & Wang, M. J., 2016 Apr 1, In : IEEE Design and Test. 33, 2, p. 30-39 10 p., 7154435.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Controller architecture for low-power, low-latency DRAM with built-in cache

Liu, Z. Y., Shih, H. C., Lin, B. Y. & Wu, C. W., 2017 Apr 1, In : IEEE Design and Test. 34, 2, p. 69-78 10 p., 7397924.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Redio: Accelerating Disk-Based Graph Processing by Reducing Disk I/Os

Wu, C., Zhang, G., Wang, Y., Jiang, X. & Zheng, W., 2019 Mar 1, In : IEEE Transactions on Computers. 68, 3, p. 414-425 12 p., 8489961.

Research output: Contribution to journalArticle

Rethinking computer architectures and software systems for phase-change memory

Wu, C., Zhang, G. & Li, K., 2016 May, In : ACM Journal on Emerging Technologies in Computing Systems. 12, 4, 33.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package

Wang, K. L., Lin, B. Y., Wu, C. W., Lee, M., Chen, H., Lin, H. C., Peng, C. N. & Wang, M. J., 2017 Jun 1, In : IEEE Design and Test. 34, 3, p. 50-58 9 p., 7464303.

Research output: Contribution to journalArticle

3 Citations (Scopus)
Chapter

Large graph computing systems

Wu, C., Zhang, G., Li, K. & Zheng, W., 2017 Jan 1, Big Data Management and Processing. CRC Press, p. 347-362 16 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

Comment/debate

The last byte: Baseball and testing

Wu, C. W., 2019 Dec, In : IEEE Design and Test. 36, 6, 1 p., 8844727.

Research output: Contribution to journalComment/debate

Conference contribution

A fast sweep-line-based failure pattern extractor for memory diagnosis

Wei, S. Y., Lin, B. Y. & Wu, C. W., 2016 Jul 22, Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016. Institute of Electrical and Electronics Engineers Inc., 7519314. (Proceedings of the European Test Workshop; vol. 2016-July).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

A Self-Organizing Map-Based Adaptive Traffic Light Control System with Reinforcement Learning

Kao, Y. C. & Wu, C. W., 2019 Feb 19, Conference Record of the 52nd Asilomar Conference on Signals, Systems and Computers, ACSSC 2018. Matthews, M. B. (ed.). IEEE Computer Society, p. 2060-2064 5 p. 8645125. (Conference Record - Asilomar Conference on Signals, Systems and Computers; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cell-Aware Test Generation Time Reduction by Using Switch-Level ATPG

Wu, C-W., Chuang, P-Y. & Chen, H. H., 2017 Sep, IEEE Int. Test Conf. in Asia (ITC-A). Taipei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation

Chen, H. H., Chen, S. Y. H., Chuang, P. Y. & Wu, C. W., 2016 Dec 22, Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016. IEEE Computer Society, p. 197-202 6 p. 7796112. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package

Huang, Y. C., Lin, B. Y., Wu, C. W., Lee, M., Chen, H., Lin, H. C., Peng, C. N. & Wang, M. J., 2016 Jun 5, Proceedings of the 53rd Annual Design Automation Conference, DAC 2016. Institute of Electrical and Electronics Engineers Inc., a58. (Proceedings - Design Automation Conference; vol. 05-09-June-2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Fault Models and Test Algorithms for Multi-Level Cell (MLC) Crossbar RRAM

Wu, C-W. & Hou, K-W., 2017 Jul, VLSI Test Technology Workshop (VTTW). Nantou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Highly Reliable and Low-Cost Symbiotic IOT Devices and Systems

Wu, C-W., Lin, B-Y., Hung, H-W., Tseng, S-M. & Chen, C., 2017 Oct, IEEE Int. Test Conf. (ITC). Fort Worth, Texas

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in Cell-Aware Test

Liu, H. W., Lin, B. Y. & Wu, C. W., 2016 Dec 22, Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016. IEEE Computer Society, p. 156-160 5 p. 7796105. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits

Marinissen, E. J., Fodor, F., Podpod, A., Stucchi, M., Jian, Y. R. & Wu, C. W., 2019 Jan 23, International Test Conference 2018, ITC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8624731. (Proceedings - International Test Conference; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Symbiotic-System Approach for IOT Devices

Wu, C-W., 2016 Nov, 25th IEEE Asian Test Symp. (ATS), Hiroshima. Hiroshima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Symbiotic system models for efficient IGT system design and test

Wu, C. W., Lin, B. Y., Hung, H. W., Tseng, S. M. & Chen, C., 2017 Nov 3, ITC-Asia 2017 - International Test Conference in Asia. Institute of Electrical and Electronics Engineers Inc., p. 71-76 6 p. 8097114. (ITC-Asia 2017 - International Test Conference in Asia).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Symbiotic System Models for Efficient IOT System Design and Test

Wu, C-W., Chen, C., Lin, B-Y., Hung, H-W. & Tseng, S-M., 2017 Sep, IEEE Int. Test Conf. in Asia (ITC-A). Taipei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Editorial

Foreword

Wu, C. W., Lee, K. J., Wang, L. C. & Huang, S. Y., 2017 Nov 3, In : ITC-Asia 2017 - International Test Conference in Asia. p. iv 8097094.

Research output: Contribution to journalEditorial