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  • 2019
  • 2018
  • 2016

Author

  • Cheng-Wen Wu
2016

A fast sweep-line-based failure pattern extractor for memory diagnosis

Wei, S. Y., Lin, B. Y. & Wu, C. W., 2016 Jul 22, Proceedings - 2016 21st IEEE European Test Symposium, ETS 2016. Institute of Electrical and Electronics Engineers Inc., 7519314. (Proceedings of the European Test Workshop; vol. 2016-July).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

A local parallel search approach for memory failure pattern identification

Lin, B. Y., Wu, C. W., Lee, M., Lin, H. C., Peng, C. N. & Wang, M. J., 2016 Mar 1, In : IEEE Transactions on Computers. 65, 3, p. 770-780 11 p., 7173026.

Research output: Contribution to journalArticle

3 Citations (Scopus)

Configurable Cubical Redundancy Schemes for Channel-Based 3-D DRAM Yield Improvement

Lin, B. Y., Chiang, W. T., Wu, C. W., Lee, M., Lin, H. C., Peng, C. N. & Wang, M. J., 2016 Apr 1, In : IEEE Design and Test. 33, 2, p. 30-39 10 p., 7154435.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation

Chen, H. H., Chen, S. Y. H., Chuang, P. Y. & Wu, C. W., 2016 Dec 22, Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016. IEEE Computer Society, p. 197-202 6 p. 7796112. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Efficient probing schemes for fine-pitch pads of InFO wafer-level chip-scale package

Huang, Y. C., Lin, B. Y., Wu, C. W., Lee, M., Chen, H., Lin, H. C., Peng, C. N. & Wang, M. J., 2016 Jun 5, Proceedings of the 53rd Annual Design Automation Conference, DAC 2016. Institute of Electrical and Electronics Engineers Inc., a58. (Proceedings - Design Automation Conference; vol. 05-09-June-2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Layout-Oriented Defect Set Reduction for Fast Circuit Simulation in Cell-Aware Test

Liu, H. W., Lin, B. Y. & Wu, C. W., 2016 Dec 22, Proceedings - 2016 IEEE 25th Asian Test Symposium, ATS 2016. IEEE Computer Society, p. 156-160 5 p. 7796105. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Rethinking computer architectures and software systems for phase-change memory

Wu, C., Zhang, G. & Li, K., 2016 May, In : ACM Journal on Emerging Technologies in Computing Systems. 12, 4, 33.

Research output: Contribution to journalArticle

5 Citations (Scopus)

Symbiotic-System Approach for IOT Devices

Wu, C-W., 2016 Nov, 25th IEEE Asian Test Symp. (ATS), Hiroshima. Hiroshima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2018

A Built-in Self-Test Scheme for Detecting Defects in FinFET-Based SRAM Circuit

Chen, M. C., Wu, T. H. & Wu, C. W., 2018 Dec 6, Proceedings - 2018 IEEE 27th Asian Test Symposium, ATS 2018. IEEE Computer Society, p. 19-24 6 p. 8567404. (Proceedings of the Asian Test Symposium; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices

Pan, Y-C., Jian, Y-R., Liu, H-H. & Wu, C-W., 2018 Jul, VLSI Test Technology Workshop (VTTW). Nantou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

An enhanced boundary scan architecture for inter-die interconnect leakage measurement in 2.5D and 3D packages

Law, P. M. P., Wu, C. W., Lin, L. Y. & Hong, H. C., 2018 Jan 24, Proceedings - 2017 IEEE 26th Asian Test Symposium, ATS 2017. Taipei: IEEE Computer Society, p. 1-6 6 p. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Automated Probe-Mark Analysis

Wu, C-W., Jian, Y-R., Fodor, F. & Marinissen, E. J., 2018 Jun, Semiconductor Wafer Test Workshop (SWTW).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Covering hard-To-detect defects by thermal quorum sensing

Chuang, P. Y., Wu, C. W. & Chen, H. H., 2018 Jun 29, Proceedings - 2018 23rd IEEE European Test Symposium, ETS 2018. Bremen: Institute of Electrical and Electronics Engineers Inc., p. 1-2 2 p. (Proceedings of the European Test Workshop; vol. 2018-May).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

RRAM-based neuromorphic hardware reliability improvement by self-healing and error correction

Hu, J. Y., Hou, K. W., Lo, C. Y., Chou, Y. F. & Wu, C. W., 2018 Sep 11, Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018. Institute of Electrical and Electronics Engineers Inc., p. 19-24 6 p. 8462942. (Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Symbiotic Controller Design Using a Memory-Based FSM Model

Kuo, S. F. & Wu, C. W., 2018 Aug 10, Proceedings - 2018 IEEE 27th International Symposium on Industrial Electronics, ISIE 2018. Institute of Electrical and Electronics Engineers Inc., p. 874-879 6 p. 8433783. (IEEE International Symposium on Industrial Electronics; vol. 2018-June).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2019

A Self-Organizing Map-Based Adaptive Traffic Light Control System with Reinforcement Learning

Kao, Y. C. & Wu, C. W., 2019 Feb 19, Conference Record of the 52nd Asilomar Conference on Signals, Systems and Computers, ACSSC 2018. Matthews, M. B. (ed.). IEEE Computer Society, p. 2060-2064 5 p. 8645125. (Conference Record - Asilomar Conference on Signals, Systems and Computers; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Redio: Accelerating Disk-Based Graph Processing by Reducing Disk I/Os

Wu, C., Zhang, G., Wang, Y., Jiang, X. & Zheng, W., 2019 Mar 1, In : IEEE Transactions on Computers. 68, 3, p. 414-425 12 p., 8489961.

Research output: Contribution to journalArticle

Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits

Marinissen, E. J., Fodor, F., Podpod, A., Stucchi, M., Jian, Y. R. & Wu, C. W., 2019 Jan 23, International Test Conference 2018, ITC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8624731. (Proceedings - International Test Conference; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

The last byte: Baseball and testing

Wu, C. W., 2019 Dec, In : IEEE Design and Test. 36, 6, 1 p., 8844727.

Research output: Contribution to journalComment/debate