A 0.5 μm concurrent testable chip of a fifth-order gm-C filter

Kuen-Jong Lee, Wei Chiang Wang

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

In this paper, we describe a testable chip of a fifth-order gm-C low-pass filter that has a passband from 0 to 4.5 MHz. We use a current-mode method for the error detection of this filter. By comparing the current consumed by the circuit under test (CUT) and the current converted from the voltage levels of the CUT, abnormal function of circuit components can be concurrently and efficiently detected. A test chip has been fabricated using a 0.5 μm, 2P2M CMOS technology. Measurement results show that this current-mode approach has little impact on the performance of the filter and can detect faults in the filter effectively. The area overhead of the circuitry for testing in this chip is about 18%.

Original languageEnglish
Pages (from-to)231-247
Number of pages17
JournalAnalog Integrated Circuits and Signal Processing
Volume32
Issue number3
DOIs
Publication statusPublished - 2002 Sep 1

Fingerprint

Networks (circuits)
Error detection
Low pass filters
Testing
Electric potential

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Hardware and Architecture
  • Surfaces, Coatings and Films

Cite this

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A 0.5 μm concurrent testable chip of a fifth-order gm-C filter. / Lee, Kuen-Jong; Wang, Wei Chiang.

In: Analog Integrated Circuits and Signal Processing, Vol. 32, No. 3, 01.09.2002, p. 231-247.

Research output: Contribution to journalArticle

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