Abstract
In this paper, we describe a testable chip of a fifth-order gm-C low-pass filter that has a passband from 0 to 4.5 MHz. We use a current-mode method for the error detection of this filter. By comparing the current consumed by the circuit under test (CUT) and the current converted from the voltage levels of the CUT, abnormal function of circuit components can be concurrently and efficiently detected. A test chip has been fabricated using a 0.5 μm, 2P2M CMOS technology. Measurement results show that this current-mode approach has little impact on the performance of the filter and can detect faults in the filter effectively. The area overhead of the circuitry for testing in this chip is about 18%.
| Original language | English |
|---|---|
| Pages (from-to) | 231-247 |
| Number of pages | 17 |
| Journal | Analog Integrated Circuits and Signal Processing |
| Volume | 32 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2002 Sep 1 |
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All Science Journal Classification (ASJC) codes
- Signal Processing
- Hardware and Architecture
- Surfaces, Coatings and Films
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A 0.5 μm concurrent testable chip of a fifth-order gm-C filter. / Lee, Kuen-Jong; Wang, Wei Chiang.
In: Analog Integrated Circuits and Signal Processing, Vol. 32, No. 3, 01.09.2002, p. 231-247.Research output: Contribution to journal › Article
TY - JOUR
T1 - A 0.5 μm concurrent testable chip of a fifth-order gm-C filter
AU - Lee, Kuen-Jong
AU - Wang, Wei Chiang
PY - 2002/9/1
Y1 - 2002/9/1
N2 - In this paper, we describe a testable chip of a fifth-order gm-C low-pass filter that has a passband from 0 to 4.5 MHz. We use a current-mode method for the error detection of this filter. By comparing the current consumed by the circuit under test (CUT) and the current converted from the voltage levels of the CUT, abnormal function of circuit components can be concurrently and efficiently detected. A test chip has been fabricated using a 0.5 μm, 2P2M CMOS technology. Measurement results show that this current-mode approach has little impact on the performance of the filter and can detect faults in the filter effectively. The area overhead of the circuitry for testing in this chip is about 18%.
AB - In this paper, we describe a testable chip of a fifth-order gm-C low-pass filter that has a passband from 0 to 4.5 MHz. We use a current-mode method for the error detection of this filter. By comparing the current consumed by the circuit under test (CUT) and the current converted from the voltage levels of the CUT, abnormal function of circuit components can be concurrently and efficiently detected. A test chip has been fabricated using a 0.5 μm, 2P2M CMOS technology. Measurement results show that this current-mode approach has little impact on the performance of the filter and can detect faults in the filter effectively. The area overhead of the circuitry for testing in this chip is about 18%.
UR - http://www.scopus.com/inward/record.url?scp=0036754881&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0036754881&partnerID=8YFLogxK
U2 - 10.1023/A:1020347608924
DO - 10.1023/A:1020347608924
M3 - Article
VL - 32
SP - 231
EP - 247
JO - Analog Integrated Circuits and Signal Processing
JF - Analog Integrated Circuits and Signal Processing
SN - 0925-1030
IS - 3
ER -