TY - GEN
T1 - A 1-V, 44.6 ppm/C bandgap reference with CDS technique
AU - Chen, Peng Yu
AU - Chang, Soon Jyh
AU - Huang, Chung Ming
AU - Lin, Chin Fu
PY - 2012
Y1 - 2012
N2 - A CMOS bandgap reference generator with switched-capacitor and corresponding double sampling techniques is presented. The proposed circuit uses a low-gain amplifier to generate an accurate reference voltage so that this structure can be implemented in low-voltage environment. With proper design, the circuit can produce any output voltage between supply voltage and ground. The circuit was designed and implemented in 0.18-m CMOS process. The core circuit occupies about 0.065 mm 2 (240 m 271 m). Measurement results show that the temperature coefficient of the output is 47.3 ppm/C in the temperature range from 40 C to 100 C. The average power consumption is about 48.1 W.
AB - A CMOS bandgap reference generator with switched-capacitor and corresponding double sampling techniques is presented. The proposed circuit uses a low-gain amplifier to generate an accurate reference voltage so that this structure can be implemented in low-voltage environment. With proper design, the circuit can produce any output voltage between supply voltage and ground. The circuit was designed and implemented in 0.18-m CMOS process. The core circuit occupies about 0.065 mm 2 (240 m 271 m). Measurement results show that the temperature coefficient of the output is 47.3 ppm/C in the temperature range from 40 C to 100 C. The average power consumption is about 48.1 W.
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U2 - 10.1109/VLSI-DAT.2012.6212660
DO - 10.1109/VLSI-DAT.2012.6212660
M3 - Conference contribution
AN - SCOPUS:84864059904
SN - 9781457720819
T3 - 2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers
BT - 2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers
T2 - 2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012
Y2 - 23 April 2012 through 25 April 2012
ER -