This paper presents a new circuit technique named residue oversampling, which is suitable for high-resolution analog-to-digital converters (ADCs). By adopting this technique and simplifying the dynamic element matching, the impacts of capacitor mismatch and noise upon the successive-approximation register ADCs are reduced significantly without calibrations. The proof-of-concept prototype was fabricated in TSMC 40-nm CMOS technology. At 40-MS/s and 10-MS/s sampling rates, the measured peak signal-to-noise and distortion ratios are 66.84 and 69.78 dB, respectively.
|Number of pages||10|
|Journal||IEEE Transactions on Circuits and Systems I: Regular Papers|
|Publication status||Published - 2018 Mar|
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering