A 12-bit 40-MS/s calibration-free SAR ADC

Chung Wei Hsu, Li Jen Chang, Chun Po Huang, Soon Jyh Chang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)


This paper presents a new circuit technique named as residue oversampling, which is suitable for high-resolution analog-to-digital converters (ADCs). By adopting this technique and simplifying dynamic element matching (DEM), the impacts of capacitor mismatch and noise upon the successive-approximation register (SAR) ADCs are diminished significantly without calibrations. The proof-of-concept prototype was fabricated in a TSMC 40-nm CMOS technology. At 40-MS/s and 10-MS/s sampling rates, the measured peak signal-to-noise-and-distortion ratios (SNDRs) are 66.84 dB and 69.78 dB, respectively.

Original languageEnglish
Title of host publicationIEEE International Symposium on Circuits and Systems
Subtitle of host publicationFrom Dreams to Innovation, ISCAS 2017 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467368520
Publication statusPublished - 2017 Sep 25
Event50th IEEE International Symposium on Circuits and Systems, ISCAS 2017 - Baltimore, United States
Duration: 2017 May 282017 May 31

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310


Other50th IEEE International Symposium on Circuits and Systems, ISCAS 2017
Country/TerritoryUnited States

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering


Dive into the research topics of 'A 12-bit 40-MS/s calibration-free SAR ADC'. Together they form a unique fingerprint.

Cite this