TY - GEN
T1 - A 12b 1.6GS/s 40mW DAC in 40nm CMOS with >70dB SFDR over entire Nyquist bandwidth
AU - Lin, Wei Te
AU - Kuo, Tai-Haur
PY - 2013/4/29
Y1 - 2013/4/29
N2 - Current-steering DACs are generally used in high-speed signal generation. The critical challenges for DACs are to realize the highest-possible spurious-free dynamic range (SFDR) and inter-modulation distortion (IMD) at the widest possible signal bandwidth. However, the above performances are degraded by many nonlinear causes, e.g., parasitic capacitor-induced finite output impedance [1], current-source (CS) mismatch, and input-code dependent switching transients [2]. While CS mismatch and input-code dependent switching transients result in distortion tones, the parasitic capacitor-induced finite output impedance further limits the high-linearity bandwidth and causes the SFDR to drop at high signal frequencies. In addition, low power consumption and small area are important factors for low-power applications and reduced implementation cost, respectively.
AB - Current-steering DACs are generally used in high-speed signal generation. The critical challenges for DACs are to realize the highest-possible spurious-free dynamic range (SFDR) and inter-modulation distortion (IMD) at the widest possible signal bandwidth. However, the above performances are degraded by many nonlinear causes, e.g., parasitic capacitor-induced finite output impedance [1], current-source (CS) mismatch, and input-code dependent switching transients [2]. While CS mismatch and input-code dependent switching transients result in distortion tones, the parasitic capacitor-induced finite output impedance further limits the high-linearity bandwidth and causes the SFDR to drop at high signal frequencies. In addition, low power consumption and small area are important factors for low-power applications and reduced implementation cost, respectively.
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U2 - 10.1109/ISSCC.2013.6487821
DO - 10.1109/ISSCC.2013.6487821
M3 - Conference contribution
AN - SCOPUS:84876564986
SN - 9781467345132
T3 - Digest of Technical Papers - IEEE International Solid-State Circuits Conference
SP - 474
EP - 475
BT - 2013 IEEE International Solid-State Circuits Conference, ISSCC 2013 - Digest of Technical Papers
T2 - 2013 60th IEEE International Solid-State Circuits Conference, ISSCC 2013
Y2 - 17 February 2013 through 21 February 2013
ER -