A bayesian approach employing generalized dirichlet priors in predicting microchip yields

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

In the production model studied by Jewell and Chou, since some of the sorting probabilities for different categories of microelectronic chips tend to be positively correlated, a Dirichlet distribution is an inappropriate prior for that model. Jewell and Chou therefore propose an approximation approach to predict coproduct yields. Since a generalized Dirichlet distribution allows variables to be positively correlated, a Bayesian method by assuming generalized Dirichlet priors is presented to calculate the probabilities of future yields in this paper. We consider not only the mean values, but also either the variances or the covariances of the sorting probabilities to construct generalized Dirichlet priors. The numerical results indicate that the generalized Dirichlet distribution should be a reasonable prior, and the computation in forecasting coproduct output is relatively straightforward with respect to the approximation approach.

Original languageEnglish
Pages (from-to)210-217
Number of pages8
JournalJournal of the Chinese Institute of Industrial Engineers
Volume22
Issue number3
DOIs
Publication statusPublished - 2005 Jan 1

All Science Journal Classification (ASJC) codes

  • Industrial and Manufacturing Engineering

Fingerprint Dive into the research topics of 'A bayesian approach employing generalized dirichlet priors in predicting microchip yields'. Together they form a unique fingerprint.

  • Cite this