Abstract
Many quality improvement programs employ measurement system analysis (MSA) to ensure the reliability of measurement results in measure phase, which are the basis for decisions regarding the behavior of critical quality characteristics. Gauge repeatability and reproducibility (R&R) study is an important approach for evaluating the precision of MSA. Although many gauge capability studies exist and are common in industry, few have discussed cases with attribute data, especially on the case related to two or more related quality characteristics simultaneously. This study presents a novel model for evaluating gauge R&R for bivariate attribute data. An example is utilized to illustrate the application process of the proposed model. The proposed model is illustrated to be capable to assess and to improve measurement systems with bivariate attribute data.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT |
| Pages | 1129-1134 |
| Number of pages | 6 |
| DOIs | |
| Publication status | Published - 2008 Dec 1 |
| Event | 4th IEEE International Conference on Management of Innovation and Technology, ICMIT - Bangkok, Thailand Duration: 2008 Sep 21 → 2008 Sep 24 |
Publication series
| Name | Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT |
|---|
Other
| Other | 4th IEEE International Conference on Management of Innovation and Technology, ICMIT |
|---|---|
| Country | Thailand |
| City | Bangkok |
| Period | 08-09-21 → 08-09-24 |
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All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Electrical and Electronic Engineering
Cite this
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A bivariate attribute measurement model for six sigma project. / Lyu, Jr Jung; Chen, Ming Nan.
Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT. 2008. p. 1129-1134 4654528 (Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - A bivariate attribute measurement model for six sigma project
AU - Lyu, Jr Jung
AU - Chen, Ming Nan
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Many quality improvement programs employ measurement system analysis (MSA) to ensure the reliability of measurement results in measure phase, which are the basis for decisions regarding the behavior of critical quality characteristics. Gauge repeatability and reproducibility (R&R) study is an important approach for evaluating the precision of MSA. Although many gauge capability studies exist and are common in industry, few have discussed cases with attribute data, especially on the case related to two or more related quality characteristics simultaneously. This study presents a novel model for evaluating gauge R&R for bivariate attribute data. An example is utilized to illustrate the application process of the proposed model. The proposed model is illustrated to be capable to assess and to improve measurement systems with bivariate attribute data.
AB - Many quality improvement programs employ measurement system analysis (MSA) to ensure the reliability of measurement results in measure phase, which are the basis for decisions regarding the behavior of critical quality characteristics. Gauge repeatability and reproducibility (R&R) study is an important approach for evaluating the precision of MSA. Although many gauge capability studies exist and are common in industry, few have discussed cases with attribute data, especially on the case related to two or more related quality characteristics simultaneously. This study presents a novel model for evaluating gauge R&R for bivariate attribute data. An example is utilized to illustrate the application process of the proposed model. The proposed model is illustrated to be capable to assess and to improve measurement systems with bivariate attribute data.
UR - http://www.scopus.com/inward/record.url?scp=56749163733&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=56749163733&partnerID=8YFLogxK
U2 - 10.1109/ICMIT.2008.4654528
DO - 10.1109/ICMIT.2008.4654528
M3 - Conference contribution
AN - SCOPUS:56749163733
SN - 9781424423309
T3 - Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT
SP - 1129
EP - 1134
BT - Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT
ER -