A bivariate attribute measurement model for six sigma project

Jr Jung Lyu, Ming Nan Chen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Many quality improvement programs employ measurement system analysis (MSA) to ensure the reliability of measurement results in measure phase, which are the basis for decisions regarding the behavior of critical quality characteristics. Gauge repeatability and reproducibility (R&R) study is an important approach for evaluating the precision of MSA. Although many gauge capability studies exist and are common in industry, few have discussed cases with attribute data, especially on the case related to two or more related quality characteristics simultaneously. This study presents a novel model for evaluating gauge R&R for bivariate attribute data. An example is utilized to illustrate the application process of the proposed model. The proposed model is illustrated to be capable to assess and to improve measurement systems with bivariate attribute data.

Original languageEnglish
Title of host publicationProceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT
Pages1129-1134
Number of pages6
DOIs
Publication statusPublished - 2008 Dec 1
Event4th IEEE International Conference on Management of Innovation and Technology, ICMIT - Bangkok, Thailand
Duration: 2008 Sep 212008 Sep 24

Publication series

NameProceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT

Other

Other4th IEEE International Conference on Management of Innovation and Technology, ICMIT
CountryThailand
CityBangkok
Period08-09-2108-09-24

Fingerprint

Gages
Systems analysis
Six sigma
Industry

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

Lyu, J. J., & Chen, M. N. (2008). A bivariate attribute measurement model for six sigma project. In Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT (pp. 1129-1134). [4654528] (Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT). https://doi.org/10.1109/ICMIT.2008.4654528
Lyu, Jr Jung ; Chen, Ming Nan. / A bivariate attribute measurement model for six sigma project. Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT. 2008. pp. 1129-1134 (Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT).
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Lyu, JJ & Chen, MN 2008, A bivariate attribute measurement model for six sigma project. in Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT., 4654528, Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT, pp. 1129-1134, 4th IEEE International Conference on Management of Innovation and Technology, ICMIT, Bangkok, Thailand, 08-09-21. https://doi.org/10.1109/ICMIT.2008.4654528

A bivariate attribute measurement model for six sigma project. / Lyu, Jr Jung; Chen, Ming Nan.

Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT. 2008. p. 1129-1134 4654528 (Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Lyu JJ, Chen MN. A bivariate attribute measurement model for six sigma project. In Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT. 2008. p. 1129-1134. 4654528. (Proceedings of the 4th IEEE International Conference on Management of Innovation and Technology, ICMIT). https://doi.org/10.1109/ICMIT.2008.4654528