A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC

Hsin Chen Chen, Cheng Rong Wu, Katherine Shu Min Li, Kuen Jong Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

The breakpoint-based silicon debug approach allows users to stop the normal (system) operations of the circuits under debug (CUDs), extract the internal states of the CUDs for examination, and then resume the normal operations for further debugging. However, most previous work on this approach adopts the transaction-level or handshake-level of granularity, i.e., the CUDs can be stopped only when a transaction or a handshake operation is completed. The granulations at these levels are often too coarse when a transaction or a handshake operation requires a large number of cycles to complete. In this paper, we present a novel debug mechanism, called the Protocol Agency Mechanism (PAM), which allows the breakpoint-based debug technique to be applied at the cycle- level granularity. The PAM can deal with transaction invalidation as well as protocol violation that may occur when a system is stopped and resumed. Experimental results show that the area overhead of the PAM is quite small and the performance impact on the system is negligible.

Original languageEnglish
Title of host publicationProceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1281-1284
Number of pages4
ISBN (Electronic)9783981537048
Publication statusPublished - 2015 Apr 22
Event2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France
Duration: 2015 Mar 92015 Mar 13

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
Volume2015-April
ISSN (Print)1530-1591

Other

Other2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
CountryFrance
CityGrenoble
Period15-03-0915-03-13

Fingerprint

Silicon
Networks (circuits)
Granulation
System-on-chip

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Chen, H. C., Wu, C. R., Li, K. S. M., & Lee, K. J. (2015). A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC. In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 (pp. 1281-1284). [7092589] (Proceedings -Design, Automation and Test in Europe, DATE; Vol. 2015-April). Institute of Electrical and Electronics Engineers Inc..
Chen, Hsin Chen ; Wu, Cheng Rong ; Li, Katherine Shu Min ; Lee, Kuen Jong. / A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC. Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 1281-1284 (Proceedings -Design, Automation and Test in Europe, DATE).
@inproceedings{0a17c864bd2e4b9c9ef43c32cf2575ba,
title = "A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC",
abstract = "The breakpoint-based silicon debug approach allows users to stop the normal (system) operations of the circuits under debug (CUDs), extract the internal states of the CUDs for examination, and then resume the normal operations for further debugging. However, most previous work on this approach adopts the transaction-level or handshake-level of granularity, i.e., the CUDs can be stopped only when a transaction or a handshake operation is completed. The granulations at these levels are often too coarse when a transaction or a handshake operation requires a large number of cycles to complete. In this paper, we present a novel debug mechanism, called the Protocol Agency Mechanism (PAM), which allows the breakpoint-based debug technique to be applied at the cycle- level granularity. The PAM can deal with transaction invalidation as well as protocol violation that may occur when a system is stopped and resumed. Experimental results show that the area overhead of the PAM is quite small and the performance impact on the system is negligible.",
author = "Chen, {Hsin Chen} and Wu, {Cheng Rong} and Li, {Katherine Shu Min} and Lee, {Kuen Jong}",
year = "2015",
month = "4",
day = "22",
language = "English",
series = "Proceedings -Design, Automation and Test in Europe, DATE",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1281--1284",
booktitle = "Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015",
address = "United States",

}

Chen, HC, Wu, CR, Li, KSM & Lee, KJ 2015, A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC. in Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015., 7092589, Proceedings -Design, Automation and Test in Europe, DATE, vol. 2015-April, Institute of Electrical and Electronics Engineers Inc., pp. 1281-1284, 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015, Grenoble, France, 15-03-09.

A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC. / Chen, Hsin Chen; Wu, Cheng Rong; Li, Katherine Shu Min; Lee, Kuen Jong.

Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 1281-1284 7092589 (Proceedings -Design, Automation and Test in Europe, DATE; Vol. 2015-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC

AU - Chen, Hsin Chen

AU - Wu, Cheng Rong

AU - Li, Katherine Shu Min

AU - Lee, Kuen Jong

PY - 2015/4/22

Y1 - 2015/4/22

N2 - The breakpoint-based silicon debug approach allows users to stop the normal (system) operations of the circuits under debug (CUDs), extract the internal states of the CUDs for examination, and then resume the normal operations for further debugging. However, most previous work on this approach adopts the transaction-level or handshake-level of granularity, i.e., the CUDs can be stopped only when a transaction or a handshake operation is completed. The granulations at these levels are often too coarse when a transaction or a handshake operation requires a large number of cycles to complete. In this paper, we present a novel debug mechanism, called the Protocol Agency Mechanism (PAM), which allows the breakpoint-based debug technique to be applied at the cycle- level granularity. The PAM can deal with transaction invalidation as well as protocol violation that may occur when a system is stopped and resumed. Experimental results show that the area overhead of the PAM is quite small and the performance impact on the system is negligible.

AB - The breakpoint-based silicon debug approach allows users to stop the normal (system) operations of the circuits under debug (CUDs), extract the internal states of the CUDs for examination, and then resume the normal operations for further debugging. However, most previous work on this approach adopts the transaction-level or handshake-level of granularity, i.e., the CUDs can be stopped only when a transaction or a handshake operation is completed. The granulations at these levels are often too coarse when a transaction or a handshake operation requires a large number of cycles to complete. In this paper, we present a novel debug mechanism, called the Protocol Agency Mechanism (PAM), which allows the breakpoint-based debug technique to be applied at the cycle- level granularity. The PAM can deal with transaction invalidation as well as protocol violation that may occur when a system is stopped and resumed. Experimental results show that the area overhead of the PAM is quite small and the performance impact on the system is negligible.

UR - http://www.scopus.com/inward/record.url?scp=84945906392&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84945906392&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84945906392

T3 - Proceedings -Design, Automation and Test in Europe, DATE

SP - 1281

EP - 1284

BT - Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

Chen HC, Wu CR, Li KSM, Lee KJ. A breakpoint-based silicon debug technique with cycle-granularity for handshake-based SoC. In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 1281-1284. 7092589. (Proceedings -Design, Automation and Test in Europe, DATE).