A built-in current sensor based on current-mode design

Kuen Jong Lee, Jing Jou Tang

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

A very simple yet powerful design of a built-in current sensor for CMOS IDDQ testing is presented. Compared with previous methods, this design has lower sensitivity to parameter deviation caused by process or temperature variations. In addition, this design provides scalable sensing resolutions and programmable current reference. Experimental results show that a test response time of less than 2 ns can be acquired when the faulty IDDQ current is higher than 250 //A.

Original languageEnglish
Pages (from-to)133-137
Number of pages5
JournalIEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing
Volume45
Issue number1
DOIs
Publication statusPublished - 1998

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Electrical and Electronic Engineering

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