Original language | English |
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Title of host publication | 10th IEEE Asian Test Symp. (ATS) |
Place of Publication | Kyoto |
Publication status | Published - 2001 Nov |
A Built-In Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM ClustersA Built-In Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Cheng-Wen Wu, C.-W. Wang, R.-S. Tzeng, C.-F. Wu, C.-T. Huang, S.-Y. Huang, S.-H. Lin, H.-P. Wang
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution