A Built-In Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM ClustersA Built-In Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters

Cheng-Wen Wu, C.-W. Wang, R.-S. Tzeng, C.-F. Wu, C.-T. Huang, S.-Y. Huang, S.-H. Lin, H.-P. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication10th IEEE Asian Test Symp. (ATS)
Place of PublicationKyoto
Publication statusPublished - 2001 Nov

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