A built-in self-test scheme for 3D RAMs

Yun Chao Yu, Che Wei Chou, Jin Fu Li, Chih Yen Lo, Ding Ming Kwai, Yung Fa Chou, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

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Mathematics

Engineering & Materials Science