A charge-pump-based current feedback method for amoled displays

Chih-Lung Lin; Fu Chieh Chang; Po Chun Lai; Po Syun Chen; Wen Yen Chang

doi:10.1109/JDT.2013.2279885

A charge-pump-based current feedback method for amoled displays

Chih-Lung Lin, Fu Chieh Chang, Po Chun Lai, Po Syun Chen, Wen Yen Chang

Department of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm

Original language	English
Article number	6588572
Pages (from-to)	783-786
Number of pages	4
Journal	IEEE/OSA Journal of Display Technology
Volume	9
Issue number	10
DOIs	https://doi.org/10.1109/JDT.2013.2279885
Publication status	Published - 2013 Oct 21

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/JDT.2013.2279885

Fingerprint Dive into the research topics of 'A charge-pump-based current feedback method for amoled displays'. Together they form a unique fingerprint.

Cite this

@article{ae50f9c325fd4f028be0b1a747bd97aa,

title = "A charge-pump-based current feedback method for amoled displays",

abstract = "This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm",

author = "Chih-Lung Lin and Chang, {Fu Chieh} and Lai, {Po Chun} and Chen, {Po Syun} and Chang, {Wen Yen}",

year = "2013",

month = oct,

day = "21",

doi = "10.1109/JDT.2013.2279885",

language = "English",

volume = "9",

pages = "783--786",

journal = "IEEE/OSA Journal of Display Technology",

issn = "1551-319X",

publisher = "IEEE Computer Society",

number = "10",

}

TY - JOUR

T1 - A charge-pump-based current feedback method for amoled displays

AU - Lin, Chih-Lung

AU - Chang, Fu Chieh

AU - Lai, Po Chun

AU - Chen, Po Syun

AU - Chang, Wen Yen

PY - 2013/10/21

Y1 - 2013/10/21

N2 - This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm

AB - This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm

UR - http://www.scopus.com/inward/record.url?scp=84885578598&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84885578598&partnerID=8YFLogxK

U2 - 10.1109/JDT.2013.2279885

DO - 10.1109/JDT.2013.2279885

M3 - Article

AN - SCOPUS:84885578598

VL - 9

SP - 783

EP - 786

JO - IEEE/OSA Journal of Display Technology

JF - IEEE/OSA Journal of Display Technology

SN - 1551-319X

IS - 10

M1 - 6588572

ER -