Abstract
This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm
| Original language | English |
|---|---|
| Article number | 6588572 |
| Pages (from-to) | 783-786 |
| Number of pages | 4 |
| Journal | IEEE/OSA Journal of Display Technology |
| Volume | 9 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 2013 Oct 21 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
Cite this
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A charge-pump-based current feedback method for amoled displays. / Lin, Chih-Lung; Chang, Fu Chieh; Lai, Po Chun; Chen, Po Syun; Chang, Wen Yen.
In: IEEE/OSA Journal of Display Technology, Vol. 9, No. 10, 6588572, 21.10.2013, p. 783-786.Research output: Contribution to journal › Article
TY - JOUR
T1 - A charge-pump-based current feedback method for amoled displays
AU - Lin, Chih-Lung
AU - Chang, Fu Chieh
AU - Lai, Po Chun
AU - Chen, Po Syun
AU - Chang, Wen Yen
PY - 2013/10/21
Y1 - 2013/10/21
N2 - This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm
AB - This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm
UR - http://www.scopus.com/inward/record.url?scp=84885578598&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84885578598&partnerID=8YFLogxK
U2 - 10.1109/JDT.2013.2279885
DO - 10.1109/JDT.2013.2279885
M3 - Article
VL - 9
SP - 783
EP - 786
JO - IEEE/OSA Journal of Display Technology
JF - IEEE/OSA Journal of Display Technology
SN - 1551-319X
IS - 10
M1 - 6588572
ER -