A charge-pump-based current feedback method for amoled displays

Chih Lung Lin; Fu Chieh Chang; Po Chun Lai; Po Syun Chen; Wen Yen Chang

doi:10.1109/JDT.2013.2279885

A charge-pump-based current feedback method for amoled displays

Chih Lung Lin, Fu Chieh Chang, Po Chun Lai, Po Syun Chen, Wen Yen Chang

Department of Electrical Engineering

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm

Original language	English
Article number	6588572
Pages (from-to)	783-786
Number of pages	4
Journal	IEEE/OSA Journal of Display Technology
Volume	9
Issue number	10
DOIs	https://doi.org/10.1109/JDT.2013.2279885
Publication status	Published - 2013

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/JDT.2013.2279885

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title = "A charge-pump-based current feedback method for amoled displays",

abstract = "This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm",

author = "Lin, {Chih Lung} and Chang, {Fu Chieh} and Lai, {Po Chun} and Chen, {Po Syun} and Chang, {Wen Yen}",

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T1 - A charge-pump-based current feedback method for amoled displays

AU - Lin, Chih Lung

AU - Chang, Fu Chieh

AU - Lai, Po Chun

AU - Chen, Po Syun

AU - Chang, Wen Yen

PY - 2013

Y1 - 2013

N2 - This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm

AB - This work presents a new external driving scheme that uses the current feedback method with a 3T1C pixel circuit. The proposed circuit provides a stable OLED driving current by compensating for the threshold voltage shift of amorphous-silicon thin-film transistors (a-Si TFTs). For fabricated a-Si TFTs and the 0.35 μ m CMOS process associated with the proposed driving scheme, measurements reveal that the normalized OLED current degradation is less than 5% after 60 hours of operation at 60 °C. Moreover, for a data line load of 1.69 KΩ110 pF, the relative error rates between data currents and OLED currents are less than 4% within a settling time of 19. μm

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A charge-pump-based current feedback method for amoled displays

Abstract

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