A CMOS 1-out-of-3 totally self-checking checker

C.-Y. Lin, Y.-R. Shieh, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationInternational Symposium on IC Design and Manufacturing (ISIC)
Place of PublicationSingapore
Pages129-134
Publication statusPublished - 1991 Sep

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