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A CMOS 1-out-of-3 totally self-checking checker

  • C.-Y. Lin
  • , Y.-R. Shieh
  • , Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original languageEnglish
Title of host publicationInternational Symposium on IC Design and Manufacturing (ISIC)
Place of PublicationSingapore
Pages129-134
Publication statusPublished - 1991 Sept

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