A compact rail-to-rail buffer with current positive-feedback for LCD source driver

Jia Hui Wang, Hao Yuan Zheng, Chien-Hung Tsai, Chin Tien Chang, Ching Chung Lee, Chen Yu Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

A new compact rail-to-rail buffer amplifier for active matrix liquid crystal display source driver applications is proposed. Two complementary buffer amplifiers driving a pair of column lines are used to realize a rail-to-rail driver. The compact buffer amplifier has a large driving capability with the function of charge and discharge provided by the current positive-feedback (CPF). The CPF can increase the charge capability in conventional class-A pMOS input buffer amplifiers and increases the discharge capability in conventional class-A nMOS input buffer amplifiers. The compact rail-to-rail buffer amplifier is implemented using 0.35μm CMOS 2-poly 4-metal process technology. The quiescent current consumed is 2.8μA and 3μA for a pMOS input buffer amplifier and an nMOS input buffer amplifier, respectively.

Original languageEnglish
Title of host publication2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
Pages43-46
Number of pages4
DOIs
Publication statusPublished - 2009 Dec 1
Event2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 - Hsinchu, Taiwan
Duration: 2009 Apr 282009 Apr 30

Publication series

Name2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09

Other

Other2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
CountryTaiwan
CityHsinchu
Period09-04-2809-04-30

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

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  • Cite this

    Wang, J. H., Zheng, H. Y., Tsai, C-H., Chang, C. T., Lee, C. C., & Wang, C. Y. (2009). A compact rail-to-rail buffer with current positive-feedback for LCD source driver. In 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 (pp. 43-46). [5158091] (2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09). https://doi.org/10.1109/VDAT.2009.5158091