A critical study on the reliability of electron temperature measurements with a langmuir probe

K. Hirao, K. Oyama

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Electron temperature deduced from a contaminated Langmuir probe is discussed. Laboratory and rocket experiments show that electron temperature evaluation is higher than the true value when the probe has a contaminated surface. It is concluded that the high temperature of the E-region is also due to the use of such a contaminated Langmuir probe. Hysteresis phenomenon can be explained by means of the simple equivalent circuit for the contamination layer of a probe surface.

Original languageEnglish
Pages (from-to)415-427
Number of pages13
JournalJournal of geomagnetism and geoelectricity
Volume24
Issue number4
DOIs
Publication statusPublished - 1972 Jan 1

All Science Journal Classification (ASJC) codes

  • Environmental Science(all)
  • Earth and Planetary Sciences(all)

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