Abstract
This paper reports a reliable current compensated reference oscillator without any BJT or external component. To maintain a stable oscillation frequency, the discharging current of the proposed architecture varies with process, supply voltage and temperature (PVT) variations. Fabricated in a 0.18-μm digital CMOS process, this oscillator consumes 0.5 mW from a 1.8-V supply. The post-simulation results show the worst case is 12%. From 500 times Monte Carlo simulation results, the frequency variations are all limited within ±3%. The measurement result of ten samples at room temperature with 10% supply voltage deviation shows variation within ±10%. The maximum variation is -10.19% with process and supply voltage variations from measurement results.
| Original language | English |
|---|---|
| Title of host publication | 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 |
| Pages | 130-133 |
| Number of pages | 4 |
| DOIs | |
| Publication status | Published - 2009 Dec 1 |
| Event | 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 - Hsinchu, Taiwan Duration: 2009 Apr 28 → 2009 Apr 30 |
Publication series
| Name | 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 |
|---|
Other
| Other | 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09 |
|---|---|
| Country | Taiwan |
| City | Hsinchu |
| Period | 09-04-28 → 09-04-30 |
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All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Control and Systems Engineering
- Electrical and Electronic Engineering
Cite this
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A current compensated reference oscillator. / Li, Wan Jing; Chang, Soon-Jyh; Lin, Ying Zu.
2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09. 2009. p. 130-133 5158112 (2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - A current compensated reference oscillator
AU - Li, Wan Jing
AU - Chang, Soon-Jyh
AU - Lin, Ying Zu
PY - 2009/12/1
Y1 - 2009/12/1
N2 - This paper reports a reliable current compensated reference oscillator without any BJT or external component. To maintain a stable oscillation frequency, the discharging current of the proposed architecture varies with process, supply voltage and temperature (PVT) variations. Fabricated in a 0.18-μm digital CMOS process, this oscillator consumes 0.5 mW from a 1.8-V supply. The post-simulation results show the worst case is 12%. From 500 times Monte Carlo simulation results, the frequency variations are all limited within ±3%. The measurement result of ten samples at room temperature with 10% supply voltage deviation shows variation within ±10%. The maximum variation is -10.19% with process and supply voltage variations from measurement results.
AB - This paper reports a reliable current compensated reference oscillator without any BJT or external component. To maintain a stable oscillation frequency, the discharging current of the proposed architecture varies with process, supply voltage and temperature (PVT) variations. Fabricated in a 0.18-μm digital CMOS process, this oscillator consumes 0.5 mW from a 1.8-V supply. The post-simulation results show the worst case is 12%. From 500 times Monte Carlo simulation results, the frequency variations are all limited within ±3%. The measurement result of ten samples at room temperature with 10% supply voltage deviation shows variation within ±10%. The maximum variation is -10.19% with process and supply voltage variations from measurement results.
UR - http://www.scopus.com/inward/record.url?scp=77950662045&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77950662045&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2009.5158112
DO - 10.1109/VDAT.2009.5158112
M3 - Conference contribution
AN - SCOPUS:77950662045
SN - 9781424427826
T3 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
SP - 130
EP - 133
BT - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
ER -