A current-mode BIST structure of DACs

Yun Che Wen, Kuen-Jong Lee

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

An effective and accurate current-mode built-in self-test (BIST) structure for DACs is presented. Differential V/I converters are used to convert the differences between the analog output voltages of the DACs and the voltage of references into currents. The offset error, gain error, integral nonlinearity (INL) and differential nonlinearity (DNL) are tested to examine whether they are within their acceptable ranges by a window current comparator. With a high performance integrator to generate a ramp signal as the reference for INL tests, the number of reference voltages can be greatly reduced such that the chip area overhead can be saved. High precision is also an advantage of this test structure due to the feature of the higher acceptable dynamic range in the current-mode design.

Original languageEnglish
Pages (from-to)147-163
Number of pages17
JournalMeasurement: Journal of the International Measurement Confederation
Volume31
Issue number3
DOIs
Publication statusPublished - 2002 Apr 1

Fingerprint

Built-in Self-test
self tests
Built-in self test
Voltage
Nonlinearity
nonlinearity
Electric potential
High Dynamic Range
electric potential
Converter
Convert
integrators
Chip
High Performance
ramps
Analogue
dynamic range
converters
Output
chips

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering

Cite this

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A current-mode BIST structure of DACs. / Wen, Yun Che; Lee, Kuen-Jong.

In: Measurement: Journal of the International Measurement Confederation, Vol. 31, No. 3, 01.04.2002, p. 147-163.

Research output: Contribution to journalArticle

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