A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices

Y.-C. Pan, Y.-R. Jian, H.-H. Liu, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationVLSI Test Technology Workshop (VTTW)
Place of PublicationNantou
Publication statusPublished - 2018 Jul

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