A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices

Y.-C. Pan, Y.-R. Jian, H.-H. Liu, Cheng-Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationVLSI Test Technology Workshop (VTTW)
Place of PublicationNantou
Publication statusPublished - 2018 Jul

Cite this

Pan, Y-C., Jian, Y-R., Liu, H-H., & Wu, C-W. (2018). A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices. In VLSI Test Technology Workshop (VTTW)