| Original language | English |
|---|---|
| Title of host publication | VLSI Test Technology Workshop (VTTW) |
| Place of Publication | Nantou |
| Publication status | Published - 2018 Jul |
A Deep Learning-Based Screening Method for Improving the Quality and Reliability of Integrated Passive Devices
Y.-C. Pan, Y.-R. Jian, H.-H. Liu, Cheng-Wen Wu
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution